Niles MacDonald

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Flow coating apparatus and method of coating
- Patent number 8,668,960
- Issue date Mar 11, 2014
- Enki Technology, Inc.
- Ramasubrahmaniam Hanumanthu
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Structural modification using electron beam activated chemical etch
- Patent number 8,052,885
- Issue date Nov 8, 2011
- KLA-Tencor Corporation
- Mehran Naser-Ghodsi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Etch selectivity enhancement in electron beam activated chemical etch
- Patent number 7,879,730
- Issue date Feb 1, 2011
- KLA-Tencor Technologies Corporation
- Mehran Naser-Ghodsi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for e-beam dark imaging with perspective control
- Patent number 7,838,833
- Issue date Nov 23, 2010
- KLA-Tencor Technologies Corporation
- Matthew Lent
- G01 - MEASURING TESTING
Information Patent Grant
Auger electron spectrometer with applied magnetic field at target s...
- Patent number 7,755,042
- Issue date Jul 13, 2010
- KLA-Tencor Corporation
- Gabor D. Toth
- G01 - MEASURING TESTING
Information Patent Grant
Transverse magnetic field voltage isolator
- Patent number 7,612,348
- Issue date Nov 3, 2009
- KLA-Technologies Corporation
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transverse magnetic field voltage isolator
- Patent number 7,394,339
- Issue date Jul 1, 2008
- KLA-Tencor Technologies Corporation
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for detecting an endpoint in a vapor phase etch
- Patent number 7,189,332
- Issue date Mar 13, 2007
- Texas Instruments Incorporated
- Satyadev R. Patel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Apparatus and method for flow of process gas in an ultra-clean envi...
- Patent number 6,949,202
- Issue date Sep 27, 2005
- Reflectivity, Inc.
- Satyadev R. Patel
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURAL MODIFICATION USING ELECTRON BEAM ACTIVATED CHEMICAL ETCH
- Publication number 20070158303
- Publication date Jul 12, 2007
- KLA-Tencor Technologies Corporation
- MEHRAN NASSER-GHODSI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ETCH SELECTIVITY ENHANCEMENT IN ELECTRON BEAM ACTIVATED CHEMICAL ETCH
- Publication number 20070158304
- Publication date Jul 12, 2007
- KLA-Tencor Technologies Corporation
- Mehran Nasser-Ghodsi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
APPARATUS AND METHOD FOR DETECTING AN ENDPOINT IN A VAPOR PHASE ETCH
- Publication number 20070119814
- Publication date May 31, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Satyadev R. Patel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Apparatus and method for detecting an endpoint in a vapor phase etch
- Publication number 20040069747
- Publication date Apr 15, 2004
- REFLECTIVITY, INC., a California corporation
- Satyadev R. Patel
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Niles MacDonald

Person

Patents Grantslast 30 patents

Flow coating apparatus and method of coating

Structural modification using electron beam activated chemical etch

Etch selectivity enhancement in electron beam activated chemical etch

Apparatus and method for e-beam dark imaging with perspective control

Auger electron spectrometer with applied magnetic field at target s...

Transverse magnetic field voltage isolator

Transverse magnetic field voltage isolator

Apparatus and method for detecting an endpoint in a vapor phase etch

Apparatus and method for flow of process gas in an ultra-clean envi...

Patents Applicationslast 30 patents

STRUCTURAL MODIFICATION USING ELECTRON BEAM ACTIVATED CHEMICAL ETCH

ETCH SELECTIVITY ENHANCEMENT IN ELECTRON BEAM ACTIVATED CHEMICAL ETCH

APPARATUS AND METHOD FOR DETECTING AN ENDPOINT IN A VAPOR PHASE ETCH

Apparatus and method for detecting an endpoint in a vapor phase etch