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Nils Ingvar Andermo
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Kirkland, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Low-profile multi-turn encoder systems and methods
Patent number
7,259,695
Issue date
Aug 21, 2007
AnderMotion Technologies LLC
Nils Ingvar Andermo
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Single-balanced shield electrode configuration for use in capacitiv...
Patent number
6,892,590
Issue date
May 17, 2005
AnderMotion Technologies LLC
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Reduced offset high accuracy induced current absolute position tran...
Patent number
6,400,138
Issue date
Jun 4, 2002
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Electronic caliper using a reduced offset induced current position...
Patent number
RE37490
Issue date
Jan 1, 2002
Mitutoyo Corporation
Nils I. Andermo
033 - Geometrical instruments
Information
Patent Grant
Reduced offset high accuracy induced current absolute position tran...
Patent number
6,329,813
Issue date
Dec 11, 2001
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Symmetric sampling
Patent number
6,304,832
Issue date
Oct 16, 2001
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Absolute position transducer having a non-binary code-track-type scale
Patent number
6,271,661
Issue date
Aug 7, 2001
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for calibrating an absolute position encoder
Patent number
6,242,906
Issue date
Jun 5, 2001
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Induced current absolute position transducer method using a code-tr...
Patent number
6,054,851
Issue date
Apr 25, 2000
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Electronic linear scale using a reduced offset high accuracy induce...
Patent number
6,049,204
Issue date
Apr 11, 2000
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrating position transducer system and method
Patent number
6,029,363
Issue date
Feb 29, 2000
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Induced current position transducer having a low power electronic c...
Patent number
6,011,389
Issue date
Jan 4, 2000
Mitutoyo Corporation
Karl Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Reduced offset high accuracy induced current position transducer
Patent number
6,005,387
Issue date
Dec 21, 1999
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Electronic linear scale using a self-contained, low-power inductive...
Patent number
6,002,250
Issue date
Dec 14, 1999
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Pitch-compensated induced current position transducer
Patent number
5,998,990
Issue date
Dec 7, 1999
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Electronic caliper using a self-contained, low power inductive posi...
Patent number
5,973,494
Issue date
Oct 26, 1999
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Method for conserving power by adjusting clock frequency based on a...
Patent number
5,948,105
Issue date
Sep 7, 1999
Mitutoyo Corporation
David Skurnik
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inductive position transducer having a multi-tap receiver winding
Patent number
5,936,399
Issue date
Aug 10, 1999
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Electronic caliper using a reduced offset induced current position...
Patent number
5,901,458
Issue date
May 11, 1999
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Electronic linear tape measure using a low power induced current po...
Patent number
5,894,678
Issue date
Apr 20, 1999
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Multi-scale induced current absolute position transducer
Patent number
5,886,519
Issue date
Mar 23, 1999
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Induced current absolute position transducer using a code-track-typ...
Patent number
5,841,274
Issue date
Nov 24, 1998
Mitutoyo Corporation
Karl G. Masreliez
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for synthesizing spatial waveforms in an elect...
Patent number
5,731,707
Issue date
Mar 24, 1998
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for fast sampling in capacitive position trans...
Patent number
5,670,887
Issue date
Sep 23, 1997
Mitutoyo Corporation
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Sealed mechanical configuration for electronic calipers for reliabl...
Patent number
5,574,381
Issue date
Nov 12, 1996
Mitutoyo Corporation
Nils I. Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Dielectric coating for capacitive position transducers to reduce se...
Patent number
5,416,424
Issue date
May 16, 1995
Mitutoyo Corporation
Nils I. Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Combination optical and capacitive absolute position apparatus and...
Patent number
5,225,830
Issue date
Jul 6, 1993
Mitutoyo
Nils I. Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance-type measuring device for absolute measurement of posit...
Patent number
5,053,715
Issue date
Oct 1, 1991
Mitutoyo Corporation
Nils I. Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance-type measuring device for absolute measurement of posit...
Patent number
5,023,559
Issue date
Jun 11, 1991
Mitutoyo Corporation
Nils I. Andermo
G01 - MEASURING TESTING
Information
Patent Grant
Electrode structure for capacitance-type measurement transducers
Patent number
4,959,615
Issue date
Sep 25, 1990
Micro Encoder, Inc.
Nils I. Andermo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Low-profile multi-turn encoder systems and methods
Publication number
20060092071
Publication date
May 4, 2006
AnderMotion Technologies LLC
Nils Ingvar Andermo
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SIGNAL-BALANCED SHIELD ELECTRODE CONFIGURATION FOR USE IN CAPACITIV...
Publication number
20050092108
Publication date
May 5, 2005
AnderMotion Technologies LLC
Nils Ingvar Andermo
G01 - MEASURING TESTING
Information
Patent Application
ABSOLUTE POSITION TRANSDUCER HAVING A NON-BINARY CODE-TRACK-TYPE SCALE
Publication number
20010003422
Publication date
Jun 14, 2001
NILS INGVAR ANDERMO
G01 - MEASURING TESTING