Nils LANGHOLZ

Person

Apolda, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Microscope and method for generating an image pieced together from...
- Patent number 11,536,943
- Issue date Dec 27, 2022
- Carl Zeiss Microscopy GmbH
- Nils Langholz
- G02 - OPTICS
Information Patent Grant
Method for determining the thickness and refractive index of a laye...
- Patent number 11,371,831
- Issue date Jun 28, 2022
- Carl Zeiss Microscopy GmbH
- Nils Langholz
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a height position of an object
- Patent number 11,287,629
- Issue date Mar 29, 2022
- Carl Zeiss Microscopy GmbH
- Nils Langholz
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic imaging method using a correction factor
- Patent number 11,238,575
- Issue date Feb 1, 2022
- Carl Zeiss Microscopy GmbH
- Viktor Drescher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscope having an objective-exchanging device
- Patent number 10,768,405
- Issue date Sep 8, 2020
- Carl Zeiss Microscopy GmbH
- Peter Schacht
- G02 - OPTICS
Information Patent Grant
Confocal microscope with aperture correlation
- Patent number 10,754,136
- Issue date Aug 25, 2020
- Carl Zeiss Microscopy GmbH
- Nils Langholz
- G01 - MEASURING TESTING
Information Patent Grant
Confocal microscope for determination of a layer thickness and micr...
- Patent number 10,436,571
- Issue date Oct 8, 2019
- Carl Zeiss Microscopy GmbH
- Matthias Vaupel
- G01 - MEASURING TESTING
Information Patent Grant
Light microscope and method for image recording using a light micro...
- Patent number 10,261,300
- Issue date Apr 16, 2019
- Carl Zeiss Microscopy GmbH
- Helmut Lippert
- G02 - OPTICS
Information Patent Grant
Device and method for microscopy using light with differing physica...
- Patent number 9,494,782
- Issue date Nov 15, 2016
- Carl Zeiss Microscopy GmbH
- Nils Langholz
- G02 - OPTICS
Information Patent Grant
Light microscope and microscopy method for examining a microscopic...
- Patent number 9,410,794
- Issue date Aug 9, 2016
- Carl Zeiss Microscopy GmbH
- Helmut Lippert
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanning microscope and method for operation thereof
- Patent number 8,879,072
- Issue date Nov 4, 2014
- Carl Zeiss Microscopy GmbH
- Nils Langholz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPE AND METHOD FOR GENERATING AN IMAGE PIECED TOGETHER FROM...
- Publication number 20210364775
- Publication date Nov 25, 2021
- CARL ZEISS MICROSCOPY GMBH
- Nils LANGHOLZ
- G02 - OPTICS
Information Patent Application
Method for Determining the Thickness and Refractive Index of a Layer
- Publication number 20210293530
- Publication date Sep 23, 2021
- CARL ZEISS MICROSCOPY GMBH
- Nils LANGHOLZ
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A HEIGHT POSITION OF AN OBJECT
- Publication number 20210239953
- Publication date Aug 5, 2021
- CARL ZEISS MICROSCOPY GMBH
- Nils LANGHOLZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING A HEIGHT POSITION OF AN OBJECT
- Publication number 20200264415
- Publication date Aug 20, 2020
- CARL ZEISS MICROSCOPY GMBH
- Nils LANGHOLZ
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPIC IMAGING METHOD USING A CORRECTION FACTOR
- Publication number 20200005442
- Publication date Jan 2, 2020
- CARL ZEISS MICROSCOPY GMBH
- VIKTOR DRESCHER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Confocal microscope for determination of a layer thickness and micr...
- Publication number 20190033054
- Publication date Jan 31, 2019
- CARL ZEISS MICROSCOPY GMBH
- Matthias Vaupel
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE HAVING AN OBJECTIVE-EXCHANGING DEVICE
- Publication number 20180231759
- Publication date Aug 16, 2018
- CARL ZEISS MICROSCOPY GMBH
- Peter Schacht
- G02 - OPTICS
Information Patent Application
CONFOCAL MICROSCOPE WITH APERTURE CORRELATION
- Publication number 20170108682
- Publication date Apr 20, 2017
- CARL ZEISS MICROSCOPY GMBH
- Nils LANGHOLZ
- G02 - OPTICS
Information Patent Application
Light microscope and microscopy method for examining a microscopic...
- Publication number 20150090908
- Publication date Apr 2, 2015
- CARL ZEISS MICROSCOPY GMBH
- Helmut Lippert
- G01 - MEASURING TESTING
Information Patent Application
Device and method for microscopy
- Publication number 20150077845
- Publication date Mar 19, 2015
- CARL ZEISS MICROSCOPY GMBH
- Nils Langholz
- G02 - OPTICS
Information Patent Application
Light microscope and method for image recording using a light micro...
- Publication number 20150054937
- Publication date Feb 26, 2015
- CARL ZEISS MICROSCOPY GMBH
- Helmut Lippert
- G02 - OPTICS
Information Patent Application
LASER SCANNING MICROSCOPE AND METHOD FOR OPERATION THEREOF
- Publication number 20120229815
- Publication date Sep 13, 2012
- NILS LANGHOLZ
- G06 - COMPUTING CALCULATING COUNTING

Nils LANGHOLZ

Person

Patents Grantslast 30 patents

Microscope and method for generating an image pieced together from...

Method for determining the thickness and refractive index of a laye...

Method for determining a height position of an object

Microscopic imaging method using a correction factor

Microscope having an objective-exchanging device

Confocal microscope with aperture correlation

Confocal microscope for determination of a layer thickness and micr...

Light microscope and method for image recording using a light micro...

Device and method for microscopy using light with differing physica...

Light microscope and microscopy method for examining a microscopic...

Laser scanning microscope and method for operation thereof

Patents Applicationslast 30 patents

MICROSCOPE AND METHOD FOR GENERATING AN IMAGE PIECED TOGETHER FROM...

Method for Determining the Thickness and Refractive Index of a Layer

METHOD FOR DETERMINING A HEIGHT POSITION OF AN OBJECT

METHOD FOR DETERMINING A HEIGHT POSITION OF AN OBJECT

MICROSCOPIC IMAGING METHOD USING A CORRECTION FACTOR

Confocal microscope for determination of a layer thickness and micr...

MICROSCOPE HAVING AN OBJECTIVE-EXCHANGING DEVICE

CONFOCAL MICROSCOPE WITH APERTURE CORRELATION

Light microscope and microscopy method for examining a microscopic...

Device and method for microscopy

Light microscope and method for image recording using a light micro...

LASER SCANNING MICROSCOPE AND METHOD FOR OPERATION THEREOF