Nina Boiadjieva

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Belmont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for probing integrated circuits using polariza...
- Patent number 7,659,981
- Issue date Feb 9, 2010
- DCG Systems, Inc.
- William Lo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for probing integrated circuits using laser il...
- Patent number 7,616,312
- Issue date Nov 10, 2009
- DCG Systems, Inc.
- Steven Kasapi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laser probing system for integrated circuits
- Publication number 20070046947
- Publication date Mar 1, 2007
- Credence Systems Corporation
- William Lo
- G01 - MEASURING TESTING
Information Patent Application
Laser probing system for integrated circuits
- Publication number 20070002329
- Publication date Jan 4, 2007
- Steven Kasapi
- G01 - MEASURING TESTING