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Nina Tikhomirova
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San Jose, CA, US
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last 30 patents
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Patent Grant
Multi-layer device
Patent number
7,696,083
Issue date
Apr 13, 2010
Endeoco Corporation
Tom Kwa
G01 - MEASURING TESTING
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Multi-layer device
Publication number
20070212818
Publication date
Sep 13, 2007
Tom Kwa
G01 - MEASURING TESTING