Cupertino, CA, US
Information
Patent Grant
QUALCOMM Incorporated
Yuxiang Peng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
QUALCOMM Incorporated
Yuxiang Peng
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
QUALCOMM Incorporated
Min Wang
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Yuxiang Peng
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
QUALCOMM Incorporated
Yuxiang Peng
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Han Zhang
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Min Wang
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Yinghua Yang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
QUALCOMM Incorporated
Jean-Michel Rousseau
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
QUALCOMM Incorporated
Bo Zheng
G08 - SIGNALLING
Information
Patent Grant
QUALCOMM Incorporated
Han Zhang
G08 - SIGNALLING
Information
Patent Grant
QUALCOMM Incorporated
Ning Luo
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
QUALCOMM Incorporated
Ning Luo
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Min Wang
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Min Wang
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Min Wang
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Min Wang
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Kannan Muthuraman
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Ning Luo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
QUALCOMM Incorporated
Min Wang
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Min Wang
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Bo Zheng
G07 - CHECKING-DEVICES
Information
Patent Grant
QUALCOMM Incorporated
Zoltan Biacs
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Bo Zheng
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
QUALCOMM Incorporated
Zoltan Biacs
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Benjamin Werner
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
QUALCOMM Incorporated
William Morrison
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Joseph Czompo
G01 - MEASURING TESTING
Information
Patent Grant
QUALCOMM Incorporated
Wyatt T. Riley
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Furqan AHMED
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
QUALCOMM Incorporated
Min WANG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Ning LUO
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
QUALCOMM Incorporated
Yinghua YANG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
QUALCOMM Incorporated
Min WANG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Min WANG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Min WANG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Jean-Michel Raymond-Marie ROUSSEAU
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Ning LUO
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Bo ZHENG
G07 - CHECKING-DEVICES
Information
Patent Application
QUALCOMM Incorporated
Han ZHANG
G08 - SIGNALLING
Information
Patent Application
QUALCOMM Incorporated
Han ZHANG
G01 - MEASURING TESTING
Information
Patent Application
QUALCOMM Incorporated
Yuxiang PENG
G01 - MEASURING TESTING
