Nir Ben-David Dodzin

Person

Hod Hasharon, IL

People

Patents Grantslast 30 patents

Information Patent Grant
System, a method and a computer program product for size estimation
- Patent number 10,545,020
- Issue date Jan 28, 2020
- Applied Materials Israel, Ltd.
- Moshe Amzaleg
- G01 - MEASURING TESTING
Information Patent Grant
System, a method and a computer program product for fitting based d...
- Patent number 10,290,092
- Issue date May 14, 2019
- Applied Materials Israel, Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection of a lithographic mask that is protected by a pellicle
- Patent number 10,156,785
- Issue date Dec 18, 2018
- Applied Materials Israel Ltd.
- Alon Litman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for attaching a mask to a mask holder
- Patent number 9,829,809
- Issue date Nov 28, 2017
- Applied Materials Israel Ltd.
- Israel Avneri
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection of a lithographic mask that is protected by a pellicle
- Patent number 9,366,954
- Issue date Jun 14, 2016
- Applied Materials Israel Ltd.
- Alon Litman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System, a method and a computer program product for CAD-based regis...
- Patent number 9,355,443
- Issue date May 31, 2016
- Applied Materials Israel, Ltd.
- Zvi Goren
- G01 - MEASURING TESTING
Information Patent Grant
System, a method and a computer program product for patch-based def...
- Patent number 9,235,885
- Issue date Jan 12, 2016
- Applied Materials Israel Ltd.
- Moshe Amzaleg
- G01 - MEASURING TESTING
Information Patent Grant
System, method and computer program product for defect detection ba...
- Patent number 9,070,014
- Issue date Jun 30, 2015
- Applied Materials Israel, Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, system, and computer program product for detection of defec...
- Patent number 9,070,180
- Issue date Jun 30, 2015
- Applied Materials Israel, Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, a method and a computer program product for CAD-based regis...
- Patent number 8,855,399
- Issue date Oct 7, 2014
- Applied Materials Israel, Ltd.
- Zvi Goren
- G01 - MEASURING TESTING
Information Patent Grant
Conductive element for electrically coupling an EUVL mask to a supp...
- Patent number 8,772,737
- Issue date Jul 8, 2014
- Applied Materials Israel, Ltd.
- Igor Krivts (Krayvitz)
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for evaluating an object
- Patent number 8,498,470
- Issue date Jul 30, 2013
- Applied Materials Israel, Ltd.
- Nir Ben-David Dodzin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION OF A LITHOGRAPHIC MASK THAT IS PROTECTED BY A PELLICLE
- Publication number 20160282714
- Publication date Sep 29, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Alon Litman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR ATTACHING A MASK TO A MASK HOLDER
- Publication number 20160161869
- Publication date Jun 9, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Israel Avneri
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM, A METHOD AND A COMPUTER PROGRAM PRODUCT FOR FITTING BASED D...
- Publication number 20150332451
- Publication date Nov 19, 2015
- Applied Materials Israel Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFEC...
- Publication number 20150287178
- Publication date Oct 8, 2015
- APPLIED MATERIALS ISRAEL LTD.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION BA...
- Publication number 20150278597
- Publication date Oct 1, 2015
- APPLIED MATERIALS ISRAEL LTD.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, A METHOD AND A COMPUTER PROGRAM PRODUCT FOR CAD-BASED REGIS...
- Publication number 20150093014
- Publication date Apr 2, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Zvi Goren
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION OF A LITHOGRAPHIC MASK THAT IS PROTECTED BY A PELLICLE
- Publication number 20150028203
- Publication date Jan 29, 2015
- Applied Materials Israel, Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS

Nir Ben-David Dodzin

Person

Patents Grantslast 30 patents

System, a method and a computer program product for size estimation

System, a method and a computer program product for fitting based d...

Inspection of a lithographic mask that is protected by a pellicle

System and method for attaching a mask to a mask holder

Inspection of a lithographic mask that is protected by a pellicle

System, a method and a computer program product for CAD-based regis...

System, a method and a computer program product for patch-based def...

System, method and computer program product for defect detection ba...

Method, system, and computer program product for detection of defec...

System, a method and a computer program product for CAD-based regis...

Conductive element for electrically coupling an EUVL mask to a supp...

Method and system for evaluating an object

Patents Applicationslast 30 patents

INSPECTION OF A LITHOGRAPHIC MASK THAT IS PROTECTED BY A PELLICLE

SYSTEM AND METHOD FOR ATTACHING A MASK TO A MASK HOLDER

SYSTEM, A METHOD AND A COMPUTER PROGRAM PRODUCT FOR FITTING BASED D...

METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFEC...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION BA...

SYSTEM, A METHOD AND A COMPUTER PROGRAM PRODUCT FOR CAD-BASED REGIS...

INSPECTION OF A LITHOGRAPHIC MASK THAT IS PROTECTED BY A PELLICLE