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Nir Ben-David
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Hod Hasharon, IL
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Patents Grants
last 30 patents
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Patent Grant
Enhancing performance of overlay metrology
Patent number
12,001,148
Issue date
Jun 4, 2024
KLA Corporation
Amnon Manassen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Enhancing performance of overlay metrology
Patent number
11,592,755
Issue date
Feb 28, 2023
KLA Corporation
Amnon Manassen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for error reduction for metrology measurements
Patent number
11,353,799
Issue date
Jun 7, 2022
Roie Volkovich
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
ENHANCING PERFORMANCE OF OVERLAY METROLOGY
Publication number
20230400780
Publication date
Dec 14, 2023
KLA Corporation
Amnon Manassen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEMS AND METHODS FOR ROTATIONAL CALIBRATION OF METROLOGY TOOLS
Publication number
20230068016
Publication date
Mar 2, 2023
KLA Corporation
Alexander Novikov
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR IMPROVED METROLOGY FOR SEMICONDUCTOR DEVICE...
Publication number
20220344218
Publication date
Oct 27, 2022
KLA Corporation
Liran Yerushalmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ENHANCING PERFORMANCE OF OVERLAY METROLOGY
Publication number
20220317577
Publication date
Oct 6, 2022
KLA Corporation
Amnon Manassen
G02 - OPTICS
Information
Patent Application
System and Method for Error Reduction for Metrology Measurements
Publication number
20220155693
Publication date
May 19, 2022
KLA Corporation
Roie Volkovich
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM, A METHOD AND A COMPUTER PROGRAM PRODUCT FOR SIZE ESTIMATION
Publication number
20140278227
Publication date
Sep 18, 2014
Applied Materials Israel Ltd.
Moshe Amzaleg
G01 - MEASURING TESTING
Information
Patent Application
METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFEC...
Publication number
20140233838
Publication date
Aug 21, 2014
APPLIED MATERIALS ISRAEL LTD.
Moshe Amzaleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION BA...
Publication number
20140233844
Publication date
Aug 21, 2014
APPLIED MATERIALS ISRAEL LTD.
Moshe Amzaleg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM, A METHOD AND A COMPUTER PROGRAM PRODUCT FOR PATCH-BASED DEF...
Publication number
20140212021
Publication date
Jul 31, 2014
APPLIED MATERIALS ISRAEL LTD.
Moshe Amzaleg
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFICATION
Publication number
20140079311
Publication date
Mar 20, 2014
APPLIED MATERIALS ISRAEL LTD.
Moshe Amzaleg
G01 - MEASURING TESTING
Information
Patent Application
CONDUCTIVE ELEMENT FOR ELECTRICALLY COUPLING AN EUVL MASK TO A SUPP...
Publication number
20130075605
Publication date
Mar 28, 2013
APPLIED MATERIALS ISRAEL, LTD.
Igor Krivts (Krayvitz)
G01 - MEASURING TESTING