Nir Blinky

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Tel Aviv, IL

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for testing a circuit
- Patent number 8,286,040
- Issue date Oct 9, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Gal Malach
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR TESTING A CIRCUIT
- Publication number 20100090706
- Publication date Apr 15, 2010
- FREESCALE SEMICONDUCTOR ,INC.
- Gal Malach
- G01 - MEASURING TESTING