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Nirit Dudovich
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Mazkeret Batya, IL
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for phase retrieval in lensless imaging
Patent number
9,970,891
Issue date
May 15, 2018
Yeda Research and Development Co. Ltd.
Nirit Dudovich
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Coherently controlled nonlinear raman spectroscopy
Patent number
7,826,051
Issue date
Nov 2, 2010
Yeda Research and Development Company Ltd.
Yaron Silberberg
G01 - MEASURING TESTING
Information
Patent Grant
Coherently controlled nonlinear Raman spectroscopy and microscopy
Patent number
7,403,282
Issue date
Jul 22, 2008
Yeda Research and Development Company Ltd.
Yaron Silberberg
G01 - MEASURING TESTING
Information
Patent Grant
Coherently controlled nonlinear Raman spectroscopy and microscopy
Patent number
7,256,885
Issue date
Aug 14, 2007
Yeda Research and Development Company Ltd.
Yaron Silberberg
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR PHASE RETRIEVAL IN LENSLESS IMAGING
Publication number
20160266057
Publication date
Sep 15, 2016
YEDA REASEARCH AND DEVELOPMENT CO. LTD.
Nirit DUDOVICH
G02 - OPTICS
Information
Patent Application
Coherently Controlled Nonlinear Raman Spectroscopy
Publication number
20080309931
Publication date
Dec 18, 2008
Yeda Research and Development Company Ltd.
Yaron Silberberg
G01 - MEASURING TESTING
Information
Patent Application
COHERENTLY CONTROLLED NONLINEAR RAMAN SPECTROSCOPY AND MICROSCOPY
Publication number
20070291264
Publication date
Dec 20, 2007
YEDA RESEARCH AND DEVELOPMENT CO., LTD.
yaron SILBERBERG
G01 - MEASURING TESTING
Information
Patent Application
COHERENTLY CONTROLLED NONLINEAR RAMAN SPECTROSCOPY AND MICROSCOPY
Publication number
20070258088
Publication date
Nov 8, 2007
YEDA RESEARCH AND DEVELOPMENT CO., LTD.
yaron SILBERBERG
G01 - MEASURING TESTING
Information
Patent Application
Coherently controlled nonlinear Raman spectroscopy and microscopy
Publication number
20040145735
Publication date
Jul 29, 2004
Yeda Research and Development Company Ltd.
Yaron Silberberg
G01 - MEASURING TESTING