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Nirmal Chindhu Warke
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Irving, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Optical distance measurement system using solid state beam steering
Patent number
12,216,270
Issue date
Feb 4, 2025
Texas Instruments Incorporated
David P. Magee
G01 - MEASURING TESTING
Information
Patent Grant
Phased spatial light modulator for imaging
Patent number
11,754,905
Issue date
Sep 12, 2023
Texas Instruments Incorporated
Jeffrey Matthew Kempf
G01 - MEASURING TESTING
Information
Patent Grant
Reduction of sampling rates in lidar systems
Patent number
11,714,194
Issue date
Aug 1, 2023
SiLC Technologies, Inc.
Majid Boloorian
G01 - MEASURING TESTING
Information
Patent Grant
Use of common chirp periods in generation of LIDAR data
Patent number
11,624,826
Issue date
Apr 11, 2023
SiLC Technologies, Inc.
Behnam Behroozpour
G01 - MEASURING TESTING
Information
Patent Grant
Virtual array method for 3D robotic vision
Patent number
11,460,551
Issue date
Oct 4, 2022
Texas Instruments Incorporated
Baher Haroun
G01 - MEASURING TESTING
Information
Patent Grant
Narrowband TIA and signaling for optical distance measurement systems
Patent number
11,428,790
Issue date
Aug 30, 2022
Texas Instruments Incorporated
Baher S. Haroun
G01 - MEASURING TESTING
Information
Patent Grant
Wireless chip-to-chip switching
Patent number
11,375,429
Issue date
Jun 28, 2022
Texas Instruments Incorporated
Nirmal Chindhu Warke
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Frequency modulation for interference free optical time of flight s...
Patent number
11,333,760
Issue date
May 17, 2022
Texas Instruments Incorporated
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for narrowband ranging systems using coarse a...
Patent number
11,231,493
Issue date
Jan 25, 2022
Texas Instruments Incorporated
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Grant
Power efficient LIDAR
Patent number
11,221,411
Issue date
Jan 11, 2022
Texas Instruments Incorporated
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Grant
Optical distance measurement system using solid state beam steering
Patent number
11,106,030
Issue date
Aug 31, 2021
Texas Instruments Incorporated
David P. Magee
G01 - MEASURING TESTING
Information
Patent Grant
Transmit signal design for an optical distance measurement system
Patent number
11,092,674
Issue date
Aug 17, 2021
Texas Instruments Incorporated
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for LIDAR operation with narrowband intensity...
Patent number
10,908,287
Issue date
Feb 2, 2021
Texas Instruments Incorporated
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Grant
Sensor array with distributed low noise amplifier
Patent number
10,879,856
Issue date
Dec 29, 2020
Texas Instruments Incorporated
Miaad Seyed Aliroteh
G01 - MEASURING TESTING
Information
Patent Grant
Receive signal beam steering and detector for an optical distance m...
Patent number
10,698,108
Issue date
Jun 30, 2020
Texas Instruments Incorporated
David P. Magee
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for LIDAR operation with pulse position modul...
Patent number
10,690,756
Issue date
Jun 23, 2020
Texas Instruments Incorporated
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for lidar operation with sequencing of pulses
Patent number
10,613,204
Issue date
Apr 7, 2020
Texas Instruments Incorporated
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for narrowband ranging systems using referenc...
Patent number
10,353,062
Issue date
Jul 16, 2019
Texas Instruments Incorporated
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for narrowband ranging systems using coarse a...
Patent number
10,145,948
Issue date
Dec 4, 2018
Texas Instruments Incorporated
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Grant
CTLE gear shifting to enable CDR frequency lock in wired communication
Patent number
10,050,814
Issue date
Aug 14, 2018
Texas Instruments Incorporated
Reza Hoshyar
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Wireless chip-to-chip switching
Patent number
9,699,705
Issue date
Jul 4, 2017
Texas Instruments Incorporated
Nirmal Chindhu Warke
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
CTLE gear shifting to enable CDR frequency lock in wired communication
Patent number
9,614,659
Issue date
Apr 4, 2017
Texas Instruments Incorporated
Reza Hoshyar
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Chip to dielectric waveguide interface for sub-millimeter wave comm...
Patent number
9,484,630
Issue date
Nov 1, 2016
Texas Instruments Incorporated
Baher S. Haroun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
IIR DFE updating gain and time constants using LMS equations
Patent number
9,479,366
Issue date
Oct 25, 2016
Texas Instruments Incorporated
Kevin Zheng
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Tunable quadrature oscillator
Patent number
9,425,739
Issue date
Aug 23, 2016
Texas Instruments Incorporated
Bradley Allen Kramer
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Frequency detector
Patent number
9,425,808
Issue date
Aug 23, 2016
Texas Instruments Incorporated
Bradley Allen Kramer
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Gear shifting from binary phase detector to PAM phase detector in C...
Patent number
9,397,824
Issue date
Jul 19, 2016
Texas Instruments Incorporated
Reza Hoshyar
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Local oscillator phase noise tracking for single carrier transmission
Patent number
9,258,107
Issue date
Feb 9, 2016
Texas Instruments Incorporated
Nirmal C. Warke
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Wireless router system
Patent number
9,240,900
Issue date
Jan 19, 2016
Texas Instruments Incorporated
Nirmal C. Warke
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Balun with integrated decoupling as ground shield
Patent number
9,166,270
Issue date
Oct 20, 2015
Texas Instruments Incorporated
Swaminathan Sankaran
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
CHANGE OF RESOLUTION IN FIELD OF VIEW
Publication number
20250076469
Publication date
Mar 6, 2025
SiLC Technologies, Inc.
Nirmal Chindhu Warke
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL CHIRP IN LIDAR OUTPUT SIGNALS
Publication number
20250012906
Publication date
Jan 9, 2025
SiLC Technologies, Inc.
Behnam Behroozpour
G01 - MEASURING TESTING
Information
Patent Application
INCREASING RESOLUTION IN IMAGING SYSTEMS
Publication number
20240345224
Publication date
Oct 17, 2024
SiLC Technologies, Inc.
Mehdi Asghari
G01 - MEASURING TESTING
Information
Patent Application
SCANNING MULTIPLE LIDAR SYSTEM OUTPUT SIGNALS
Publication number
20240255618
Publication date
Aug 1, 2024
SiLC Technologies, Inc.
Mehdi Asghari
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING TECHNIQUES FOR LIDAR RECEIVER USING SPATIAL LIGHT MODULA...
Publication number
20240201376
Publication date
Jun 20, 2024
TEXAS INSTRUMENTS INCORPORATED
Terry A. Bartlett
G01 - MEASURING TESTING
Information
Patent Application
COMBINING DATA FROM DIFFERENT SAMPLE REGIONS IN AN IMAGING SYSTEM F...
Publication number
20240085559
Publication date
Mar 14, 2024
SiLC Technologies, Inc.
Nirmal Chindhu Warke
G01 - MEASURING TESTING
Information
Patent Application
IMAGING SYTEM WITH ENHANCED SCAN RATE
Publication number
20240012112
Publication date
Jan 11, 2024
SiLC Technologies, Inc.
Nirmal Chindhu Warke
G01 - MEASURING TESTING
Information
Patent Application
ADJUSTING IMAGING SYSTEM DATA IN RESPONSE TO EDGE EFFECTS
Publication number
20230288566
Publication date
Sep 14, 2023
SiLC Technologies, Inc.
Siddhant Nadkarni
G01 - MEASURING TESTING
Information
Patent Application
IMAGING SYSTEM HAVING REDUCED ADC SAMPLING RATES
Publication number
20230288567
Publication date
Sep 14, 2023
SiLC Technologies, Inc.
Mehdi Asghari
G01 - MEASURING TESTING
Information
Patent Application
INCREASING RATE OF LIDAR MEASUREMENTS
Publication number
20230104453
Publication date
Apr 6, 2023
SiLC Technologies, Inc.
Mehdi Asghari
G01 - MEASURING TESTING
Information
Patent Application
USE OF MULTIPLE STEERING MECHANISMS IN SCANNING
Publication number
20230069201
Publication date
Mar 2, 2023
SiLC Technologies, Inc.
Mehdi Asghari
G01 - MEASURING TESTING
Information
Patent Application
VIRTUAL ARRAY METHOD FOR 3D ROBOTIC VISION
Publication number
20220413106
Publication date
Dec 29, 2022
TEXAS INSTRUMENTS INCORPORATED
Baher HAROUN
G01 - MEASURING TESTING
Information
Patent Application
SCANNING MULTIPLE LIDAR SYSTEM OUTPUT SIGNALS
Publication number
20220404470
Publication date
Dec 22, 2022
SiLC Technologies, Inc.
Mehdi Asghari
G02 - OPTICS
Information
Patent Application
NARROWBAND TIA AND SIGNALING FOR OPTICAL DISTANCE MEASUREMENT SYSTEMS
Publication number
20220397649
Publication date
Dec 15, 2022
TEXAS INSTRUMENTS INCORPORATED
Baher S. Haroun
G01 - MEASURING TESTING
Information
Patent Application
USE OF COMMON CHIRP PERIODS IN GENERATION OF LIDAR DATA
Publication number
20210349216
Publication date
Nov 11, 2021
SiLC Technologies, Inc.
Behnam Behroozpour
G01 - MEASURING TESTING
Information
Patent Application
REDUCTION OF SAMPLING RATES IN LIDAR SYSTEMS
Publication number
20210318436
Publication date
Oct 14, 2021
SiLC Technologies, Inc.
Majid Boloorian
G01 - MEASURING TESTING
Information
Patent Application
PHASED SPATIAL LIGHT MODULATOR FOR IMAGING
Publication number
20210096442
Publication date
Apr 1, 2021
TEXAS INSTRUMENTS INCORPORATED
Jeffrey Matthew Kempf
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR LIDAR OPERATION WITH SEQUENCING OF PULSES
Publication number
20200292681
Publication date
Sep 17, 2020
TEXAS INSTRUMENTS INCORPORATED
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Application
VIRTUAL ARRAY METHOD FOR 3D ROBOTIC VISION
Publication number
20200209359
Publication date
Jul 2, 2020
TEXAS INSTRUMENTS INCORPORATED
Baher HAROUN
G01 - MEASURING TESTING
Information
Patent Application
SENSOR ARRAY WITH DISTRIBUTED LOW NOISE AMPLIFIER
Publication number
20200212854
Publication date
Jul 2, 2020
TEXAS INSTRUMENTS INCORPORATED
Miaad SEYED ALIROTEH
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHODS AND APPARATUS FOR NARROWBAND RANGING SYSTEMS USING COARSE A...
Publication number
20190101633
Publication date
Apr 4, 2019
TEXAS INSTRUMENTS INCORPORATED
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Application
TRANSMIT SIGNAL DESIGN FOR AN OPTICAL DISTANCE MEASUREMENT SYSTEM
Publication number
20190018107
Publication date
Jan 17, 2019
TEXAS INSTRUMENTS INCORPORATED
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY MODULATION FOR INTERFERENCE FREE OPTICAL TIME OF FLIGHT S...
Publication number
20190018138
Publication date
Jan 17, 2019
TEXAS INSTRUMENTS INCORPORATED
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Application
NARROWBAND TIA AND SIGNALING FOR OPTICAL DISTANCE MEASUREMENT SYSTEMS
Publication number
20180348345
Publication date
Dec 6, 2018
TEXAS INSTRUMENTS INCORPORATED
Baher S. Haroun
G01 - MEASURING TESTING
Information
Patent Application
RECEIVE SIGNAL BEAM STEERING AND DETECTOR FOR AN OPTICAL DISTANCE M...
Publication number
20180341020
Publication date
Nov 29, 2018
TEXAS INSTRUMENTS INCORPORATED
David P. Magee
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR NARROWBAND RANGING SYSTEMS USING COARSE A...
Publication number
20180017672
Publication date
Jan 18, 2018
TEXAS INSTRUMENTS INCORPORATED
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR NARROWBAND RANGING SYSTEMS USING REFERENC...
Publication number
20180017671
Publication date
Jan 18, 2018
TEXAS INSTRUMENTS INCORPORATED
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Application
POWER EFFICIENT LIDAR
Publication number
20180017678
Publication date
Jan 18, 2018
TEXAS INSTRUMENTS INCORPORATED
Nirmal C. Warke
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING TECHNIQUES FOR LIDAR RECEIVER USING SPATIAL LIGHT MODULA...
Publication number
20170357000
Publication date
Dec 14, 2017
TEXAS INSTRUMENTS INCORPORATED
Terry A. Bartlett
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR LIDAR OPERATION WITH PULSE POSITION MODUL...
Publication number
20170329010
Publication date
Nov 16, 2017
TEXAS INSTRUMENTS INCORPORATED
Nirmal C. Warke
G01 - MEASURING TESTING