Nisar Ahmed

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Bee Cave, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Test control point insertion and X-bounding for logic built-in self...
- Patent number 9,547,043
- Issue date Jan 17, 2017
- NXP USA, INC.
- Nisar Ahmed
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self test (BIST) with clock control
- Patent number 9,298,572
- Issue date Mar 29, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Nisar Ahmed
- G01 - MEASURING TESTING
Information Patent Grant
Resolution programmable dynamic IR-drop sensor with peak IR-drop tr...
- Patent number 9,043,620
- Issue date May 26, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Xiaoxiao Wang
- G01 - MEASURING TESTING
Information Patent Grant
Path-based crosstalk fault test scanning in built-in self-testing
- Patent number 8,788,897
- Issue date Jul 22, 2014
- Texas Instruments Incorporated
- Nisar Ahmed
- G01 - MEASURING TESTING
Information Patent Grant
At-speed transition fault testing with low speed scan enable
- Patent number 7,640,475
- Issue date Dec 29, 2009
- Texas Instruments Incorporated
- Chennagiri P. Ravikumar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN SELF TEST (BIST) WITH CLOCK CONTROL
- Publication number 20140281778
- Publication date Sep 18, 2014
- Nisar Ahmed
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF TEST (BIST) WITH CLOCK CONTROL
- Publication number 20140281717
- Publication date Sep 18, 2014
- NISAR AHMED
- G01 - MEASURING TESTING
Information Patent Application
RESOLUTION PROGRAMMABLE DYNAMIC IR-DROP SENSOR WITH PEAK IR-DROP TR...
- Publication number 20140281642
- Publication date Sep 18, 2014
- XIAOXIAO WANG
- G01 - MEASURING TESTING
Information Patent Application
TEST CONTROL POINT INSERTION AND X-BOUNDING FOR LOGIC BUILT-IN SELF...
- Publication number 20140258798
- Publication date Sep 11, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Nisar Ahmed
- G01 - MEASURING TESTING
Information Patent Application
PATH-BASED CROSSTALK FAULT TEST SCANNING IN BUILT-IN SELF-TESTING
- Publication number 20140095951
- Publication date Apr 3, 2014
- Texas Instruments, Incorporated
- Nisar Ahmed
- G01 - MEASURING TESTING