Nissim Elmaliach

Follow

Person

Raanana, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-spot collection optics
- Patent number 9,702,983
- Issue date Jul 11, 2017
- Applied Materials Israel, Ltd.
- Haim Eder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spot grid array scanning system
- Patent number 7,468,506
- Issue date Dec 23, 2008
- Applied Materials, Israel, Ltd.
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Optical spot grid array scanning system
- Patent number 7,468,507
- Issue date Dec 23, 2008
- Applied Materials, Israel, Ltd.
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 7,053,395
- Issue date May 30, 2006
- Applied Materials, Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 6,853,475
- Issue date Feb 8, 2005
- Applied Materials Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 6,809,808
- Issue date Oct 26, 2004
- Applied Materials, Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Data converter apparatus and method particularly useful for a datab...
- Patent number 6,366,687
- Issue date Apr 2, 2002
- Applied Materials, Inc.
- Meir Aloni
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-SPOT COLLECTION OPTICS
- Publication number 20140197322
- Publication date Jul 17, 2014
- APPLIED MATERIALS ISRAEL LTD.
- Haim Eder
- G01 - MEASURING TESTING
Information Patent Application
Optical spot grid array scanning system
- Publication number 20070133077
- Publication date Jun 14, 2007
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Application
Spot grid array scanning system
- Publication number 20060261261
- Publication date Nov 23, 2006
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20040080740
- Publication date Apr 29, 2004
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20040075068
- Publication date Apr 22, 2004
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20030179369
- Publication date Sep 25, 2003
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS