Nissim Elmaliah

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Raanana, IL

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Patents Grantslast 30 patents

Information Patent Grant
Focusing a charged particle system
- Patent number 9,530,613
- Issue date Dec 27, 2016
- Applied Materials Israel, Ltd.
- Steven R. Rogers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle multi-beam inspection system and method of operati...
- Patent number 9,263,233
- Issue date Feb 16, 2016
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focusing a charged particle imaging system
- Patent number 9,099,282
- Issue date Aug 4, 2015
- Applied Materials Israel, Ltd.
- Steven R. Rogers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput multi beam detection system and method
- Patent number 7,504,622
- Issue date Mar 17, 2009
- Applied Materials, Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FOCUSING A CHARGED PARTICLE SYSTEM
- Publication number 20150287568
- Publication date Oct 8, 2015
- Steven R. Rodgers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MULTI-BEAM INSPECTION SYSTEM AND METHOD OF OPERATI...
- Publication number 20150090879
- Publication date Apr 2, 2015
- CARL ZEISS MICROSCOPY GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSING A CHARGED PARTICLE IMAGING SYSTEM
- Publication number 20140224985
- Publication date Aug 14, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Steven R. Rodgers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High throughput multi beam detection system and method
- Publication number 20070228274
- Publication date Oct 4, 2007
- Emanuel Elyasaf
- G01 - MEASURING TESTING