Membership
Tour
Register
Log in
Niteen A. Patkar
Follow
Person
Burlingame, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Testing replicated sub-systems in a yield-enhancing chip-test envir...
Patent number
7,263,642
Issue date
Aug 28, 2007
Azul Systems, Inc.
Samy R. Makar
G01 - MEASURING TESTING