TREA

Nitin Bhagwath

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  • Roseville, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Bypassing a device in a scan chain
    • Patent number 7,246,282
    • Issue date Jul 17, 2007
    • Hewlett-Packard Development Company, L.P.
    • Andrew Chau
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents