Nitish Kumar

Follow

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,692,948
- Issue date Jul 4, 2023
- ASML Netherlands B.V.
- Nitish Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Position metrology apparatus and associated optical elements
- Patent number 11,428,925
- Issue date Aug 30, 2022
- ASML Netherlands B.V.
- Arjan Johannes Anton Beukman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for deriving corrections, method and apparatus...
- Patent number 11,243,470
- Issue date Feb 8, 2022
- ASML Netherlands B.V.
- Nitish Kumar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for detecting substrate surface variations
- Patent number 11,092,902
- Issue date Aug 17, 2021
- ASML Netherlands B.V.
- Johannes Franciscus Martinus D'Achard Van Enschut
- G01 - MEASURING TESTING
Information Patent Grant
Radiation source
- Patent number 10,690,995
- Issue date Jun 23, 2020
- ASML Netherlands B.V.
- Nitish Kumar
- G02 - OPTICS
Information Patent Grant
Metrology methods, metrology apparatus and device manufacturing method
- Patent number 10,254,644
- Issue date Apr 9, 2019
- ASML Netherlands B.V.
- Richard Quintanilha
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230296533
- Publication date Sep 21, 2023
- ASML NETHERLANDS B.V.
- Nitish KUMAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20200348244
- Publication date Nov 5, 2020
- ASML NETHERLANDS B.V.
- Nitish KUMAR
- G01 - MEASURING TESTING
Information Patent Application
Position Metrology Apparatus and Associated Optical Elements
- Publication number 20200209608
- Publication date Jul 2, 2020
- ASML NETHERLANDS B.V.
- Arjan Johannes Anton Beukman
- G02 - OPTICS
Information Patent Application
Radiation Source
- Publication number 20190302570
- Publication date Oct 3, 2019
- ASML NETHERLANDS B.V.
- Nitish KUMAR
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR DERIVING CORRECTIONS, METHOD AND APPARATUS...
- Publication number 20190212660
- Publication date Jul 11, 2019
- ASML NETHERLANDS B.V.
- Nitish KUMAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Methods, Metrology Apparatus and Device Manufacturing Method
- Publication number 20170357155
- Publication date Dec 14, 2017
- ASML NETHERLANDS B.V.
- Richard QUINTANILHA
- G01 - MEASURING TESTING