Noah Elliot BAKER

Person

West Linn, OR, US

People

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR RADIO FREQUENCY GRID DESIGN IN AN ESC TO R...
- Publication number 20250038034
- Publication date Jan 30, 2025
- LAM RESEARCH CORPORATION
- Stephen Topping
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR MONITORING PERFORMANCE OF ELECTROSTATIC CHUCKS IN SUBSTR...
- Publication number 20250022740
- Publication date Jan 16, 2025
- LAM RESEARCH CORPORATION
- Liwei AN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REMOTE PLASMA DEPOSITION WITH ELECTROSTATIC CLAMPING
- Publication number 20240387226
- Publication date Nov 21, 2024
- LAM RESEARCH CORPORATION
- Aaron Blake MILLER
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ANOMALOUS PLASMA EVENT DETECTION AND MITIGATION IN SEMICONDUCTOR PR...
- Publication number 20240355600
- Publication date Oct 24, 2024
- LAM RESEARCH CORPORATION
- Sunil Kapoor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER STATE DETECTION
- Publication number 20240219165
- Publication date Jul 4, 2024
- LAM RESEARCH CORPORATION
- Noah Elliot Baker
- G01 - MEASURING TESTING
Information Patent Application
MONOLITHIC ANISOTROPIC SUBSTRATE SUPPORTS
- Publication number 20240128062
- Publication date Apr 18, 2024
- LAM RESEARCH CORPORATION
- Joel HOLLINGSWORTH
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
DETECTION AND LOCATION OF ANOMALOUS PLASMA EVENTS IN FABRICATION CH...
- Publication number 20220406578
- Publication date Dec 22, 2022
- LAM RESEARCH CORPORATION
- Yukinori Sakiyama
- G01 - MEASURING TESTING
Information Patent Application
ANOMALOUS PLASMA EVENT DETECTION AND MITIGATION IN SEMICONDUCTOR PR...
- Publication number 20220037135
- Publication date Feb 3, 2022
- LAM RESEARCH CORPORATION
- Sunil Kapoor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE STATE DETECTION FOR PLASMA PROCESSING TOOLS
- Publication number 20210391141
- Publication date Dec 16, 2021
- Lam Reesarch Corporation
- Noah Elliot BAKER
- H01 - BASIC ELECTRIC ELEMENTS

Noah Elliot BAKER

Person

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR RADIO FREQUENCY GRID DESIGN IN AN ESC TO R...

SYSTEM FOR MONITORING PERFORMANCE OF ELECTROSTATIC CHUCKS IN SUBSTR...

REMOTE PLASMA DEPOSITION WITH ELECTROSTATIC CLAMPING

ANOMALOUS PLASMA EVENT DETECTION AND MITIGATION IN SEMICONDUCTOR PR...

WAFER STATE DETECTION

MONOLITHIC ANISOTROPIC SUBSTRATE SUPPORTS

DETECTION AND LOCATION OF ANOMALOUS PLASMA EVENTS IN FABRICATION CH...

ANOMALOUS PLASMA EVENT DETECTION AND MITIGATION IN SEMICONDUCTOR PR...

SUBSTRATE STATE DETECTION FOR PLASMA PROCESSING TOOLS