Noam Dotan

Person

Givaetain, IL

People

Patents Grantslast 30 patents

Information Patent Grant
System for detection of wafer defects
- Patent number 7,961,763
- Issue date Jun 14, 2011
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,843,559
- Issue date Nov 30, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects in wafers
- Patent number 7,813,541
- Issue date Oct 12, 2010
- Applied Materials South East Asia Pte. Ltd.
- Erez Sali
- G01 - MEASURING TESTING
Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,804,590
- Issue date Sep 28, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining optimum position of focus of an imaging s...
- Patent number 7,633,041
- Issue date Dec 15, 2009
- Applied Materials South East Asia Pte, Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of water defects
- Patent number 7,525,659
- Issue date Apr 28, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,480,039
- Issue date Jan 20, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,477,383
- Issue date Jan 13, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,274,444
- Issue date Sep 25, 2007
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optical illumination system
- Patent number 7,260,298
- Issue date Aug 21, 2007
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,180,586
- Issue date Feb 20, 2007
- Negevtech Ltd.
- Gad Neumann
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optical illumination system
- Patent number 6,892,013
- Issue date May 10, 2005
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Secondary electron spectroscopy method and system
- Patent number 6,627,886
- Issue date Sep 30, 2003
- Applied Materials, Inc.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focusing method and system
- Patent number 6,521,891
- Issue date Feb 18, 2003
- Applied Materials, Inc.
- Noam Dotan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for automatic analysis of defect material on semi...
- Patent number 6,407,386
- Issue date Jun 18, 2002
- Applied Materials, Inc.
- Noam Dotan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for reviewing defects on an object
- Patent number 6,407,373
- Issue date Jun 18, 2002
- Applied Materials, Inc.
- Noam Dotan
- G01 - MEASURING TESTING
Information Patent Grant
Determining defect depth and contour information in wafer structure...
- Patent number 6,353,222
- Issue date Mar 5, 2002
- Applied Materials, Inc.
- Noam Dotan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for display panel inspection
- Patent number 6,215,895
- Issue date Apr 10, 2001
- Orbotech Ltd.
- Erez Sali
- G02 - OPTICS
Information Patent Grant
SEM image enhancement using narrow band detection and color assignment
- Patent number 6,201,240
- Issue date Mar 13, 2001
- Applied Materials, Inc.
- Noam Dotan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing aliasing effects in scanning beam microscopy
- Patent number 6,194,718
- Issue date Feb 27, 2001
- Applied Materials, Inc.
- Noam Dotan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for display panel inspection
- Patent number 5,771,068
- Issue date Jun 23, 1998
- Orbotech Ltd.
- Erez Sali
- G02 - OPTICS
Information Patent Grant
Reliable defect detection using multiple perspective scanning elect...
- Patent number 5,659,172
- Issue date Aug 19, 1997
- Opal Technologies Ltd.
- Mark Wagner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical inspection system for distinguishing between first and seco...
- Patent number 5,216,479
- Issue date Jun 1, 1993
- Optrotech Ltd.
- Noam Dotan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multi mode inspection method and apparatus
- Publication number 20090091749
- Publication date Apr 9, 2009
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Multi mode inspection method and apparatus
- Publication number 20070291256
- Publication date Dec 20, 2007
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Fiber optical illumination system
- Publication number 20070146694
- Publication date Jun 28, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070019856
- Publication date Jan 25, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070013903
- Publication date Jan 18, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244956
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244958
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244957
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting defects in wafers
- Publication number 20060193507
- Publication date Aug 31, 2006
- Negevtech Ltd.
- Erez Sali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Programmable spatial filter for wafer inspection
- Publication number 20060012781
- Publication date Jan 19, 2006
- NEGEVTECH LTD.
- Keren Fradkin
- G01 - MEASURING TESTING
Information Patent Application
Multi mode inspection method and apparatus
- Publication number 20060007434
- Publication date Jan 12, 2006
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Fiber optical illumination system
- Publication number 20050180707
- Publication date Aug 18, 2005
- NEGEVTECH LTD.
- Dov Furman
- G02 - OPTICS
Information Patent Application
System for detection of wafer defects
- Publication number 20050110987
- Publication date May 26, 2005
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20040146295
- Publication date Jul 29, 2004
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Fiber optical illumination system
- Publication number 20040136665
- Publication date Jul 15, 2004
- NEGEVTECH LTD.
- Dov Furman
- G02 - OPTICS

Person

Patents Grantslast 30 patents

System for detection of wafer defects

System for detection of wafer defects

Method and apparatus for detecting defects in wafers

Multi mode inspection method and apparatus

Apparatus for determining optimum position of focus of an imaging s...

System for detection of water defects

Multi mode inspection method and apparatus

System for detection of wafer defects

Multi mode inspection method and apparatus

Fiber optical illumination system

System for detection of wafer defects

Fiber optical illumination system

Secondary electron spectroscopy method and system

Focusing method and system

System and method for automatic analysis of defect material on semi...

Apparatus and method for reviewing defects on an object

Determining defect depth and contour information in wafer structure...

Apparatus and method for display panel inspection

SEM image enhancement using narrow band detection and color assignment

Method for reducing aliasing effects in scanning beam microscopy

Apparatus and method for display panel inspection

Reliable defect detection using multiple perspective scanning elect...

Optical inspection system for distinguishing between first and seco...

Patents Applicationslast 30 patents

Multi mode inspection method and apparatus

Multi mode inspection method and apparatus

Fiber optical illumination system

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

Method and apparatus for detecting defects in wafers

Programmable spatial filter for wafer inspection

Multi mode inspection method and apparatus

Fiber optical illumination system

System for detection of wafer defects

System for detection of wafer defects

Fiber optical illumination system