NOAM TAL

Person

REHOVOT, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology and process control for semiconductor manufacturing
- Patent number 12,236,364
- Issue date Feb 25, 2025
- Nova Ltd.
- Eitan Rothstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for controlling measurements of sample's parameters
- Patent number 11,874,606
- Issue date Jan 16, 2024
- Nova Ltd.
- Barak Bringoltz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Machine and deep learning methods for spectra-based metrology and p...
- Patent number 11,815,819
- Issue date Nov 14, 2023
- Nova Ltd.
- Barak Bringoltz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology and process control for semiconductor manufacturing
- Patent number 11,763,181
- Issue date Sep 19, 2023
- Nova Ltd.
- Eitan Rothstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology and process control for semiconductor manufacturing
- Patent number 11,093,840
- Issue date Aug 17, 2021
- Nova Measuring Instruments Ltd.
- Eitan Rothstein
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
- Publication number 20250086781
- Publication date Mar 13, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Boaz STURLESI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND P...
- Publication number 20240310737
- Publication date Sep 19, 2024
- NOVA LTD
- Barak BRINGOLTZ
- G05 - CONTROLLING REGULATING
Information Patent Application
MACHINE LEARNING BASED EXAMINATION FOR PROCESS MONITORING
- Publication number 20240281956
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Noam TAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED YIELD PREDICTION
- Publication number 20240281958
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris LEVANT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
END-TO-END MEASUREMENT FOR SEMICONDUCTOR SPECIMENS
- Publication number 20240105522
- Publication date Mar 28, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Tomer Haim PELED
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20240078450
- Publication date Mar 7, 2024
- NOVA LTD
- EITAN ROTHSTEIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for controlling measurements of sample's parameters
- Publication number 20230185203
- Publication date Jun 15, 2023
- NOVA LTD
- Barak BRINGOLTZ
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND P...
- Publication number 20230124431
- Publication date Apr 20, 2023
- NOVA LTD
- Barak BRINGOLTZ
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20220036218
- Publication date Feb 3, 2022
- NOVA LTD
- EITAN ROTHSTEIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20210150387
- Publication date May 20, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- EITAN ROTHSTEIN
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Metrology and process control for semiconductor manufacturing

System and method for controlling measurements of sample's parameters

Machine and deep learning methods for spectra-based metrology and p...

Metrology and process control for semiconductor manufacturing

Metrology and process control for semiconductor manufacturing

Patents Applicationslast 30 patents

MACHINE LEARNING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS

MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND P...

MACHINE LEARNING BASED EXAMINATION FOR PROCESS MONITORING

MACHINE LEARNING BASED YIELD PREDICTION

END-TO-END MEASUREMENT FOR SEMICONDUCTOR SPECIMENS

METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING

System and method for controlling measurements of sample's parameters

MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND P...

METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING

METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING