Noboru Higashi

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Substrate processing apparatus
- Patent number 10,153,182
- Issue date Dec 11, 2018
- Kurashiki Boseki Kabushiki Kaisha
- Noboru Higashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for attenuated total reflection far ultraviolet spectroscopy...
- Patent number 8,390,816
- Issue date Mar 5, 2013
- Kurashiki Boseki Kabushiki Kaisha
- Noboru Higashi
- G01 - MEASURING TESTING
Information Patent Grant
Attenuated total reflection optical probe and apparatus therewith f...
- Patent number 7,978,331
- Issue date Jul 12, 2011
- Kurashiki Boseki Kabushiki Kaisha
- Noboru Higashi
- G01 - MEASURING TESTING
Information Patent Grant
Attenuated total reflection probe and spectrometer therewith
- Patent number 7,791,729
- Issue date Sep 7, 2010
- Kurashiki Boseki Kabushiki Kaisha
- Noboru Higashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical density measuring apparatus
- Patent number 5,991,031
- Issue date Nov 23, 1999
- Kurashiki Boseki Kabushiki Kaisha
- Noboru Higashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRODE SHEET, ALL-SOLID BATTERY, METHOD FOR MANUFACTURING ELECTR...
- Publication number 20210111435
- Publication date Apr 15, 2021
- Kurashiki Boseki Kabushiki Kaisha
- Noboru HIGASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MEASURING CONCENTRATION OF ADVANCED-OXIDAT...
- Publication number 20150021491
- Publication date Jan 22, 2015
- KURASHIKI BOSEKI KABUSHIKI KAISHA
- Noboru Higashi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING CONCENTRATION OF ADVANCED-OXIDAT...
- Publication number 20140065717
- Publication date Mar 6, 2014
- KURASHIKI BOSEKI KABUSHIKI KAISHA
- Noboru Higashi
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20130048215
- Publication date Feb 28, 2013
- TOKYO ELECTRON LIMITED
- Noboru Higashi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ATTENUATED TOTAL REFLECTION FAR ULTRAVIOLET SPECTROSCOPY...
- Publication number 20110013193
- Publication date Jan 20, 2011
- Noboru Higashi
- G01 - MEASURING TESTING
Information Patent Application
ATTENUATED TOTAL REFLECTION OPTICAL PROBE AND APPARATUS THEREWITH F...
- Publication number 20090073436
- Publication date Mar 19, 2009
- Noboru Higashi
- G01 - MEASURING TESTING
Information Patent Application
Attenuated total reflection probe and spectrometer therewith
- Publication number 20080218734
- Publication date Sep 11, 2008
- Kurashiki Boseki Kabushiki Kaisha
- Noboru Higashi
- G01 - MEASURING TESTING

Noboru Higashi

Person

Patents Grantslast 30 patents

Substrate processing apparatus

Method for attenuated total reflection far ultraviolet spectroscopy...

Attenuated total reflection optical probe and apparatus therewith f...

Attenuated total reflection probe and spectrometer therewith

Optical density measuring apparatus

Patents Applicationslast 30 patents

ELECTRODE SHEET, ALL-SOLID BATTERY, METHOD FOR MANUFACTURING ELECTR...

METHOD AND APPARATUS FOR MEASURING CONCENTRATION OF ADVANCED-OXIDAT...

METHOD AND APPARATUS FOR MEASURING CONCENTRATION OF ADVANCED-OXIDAT...

SUBSTRATE PROCESSING APPARATUS

METHOD FOR ATTENUATED TOTAL REFLECTION FAR ULTRAVIOLET SPECTROSCOPY...

ATTENUATED TOTAL REFLECTION OPTICAL PROBE AND APPARATUS THEREWITH F...

Attenuated total reflection probe and spectrometer therewith