Noboru Koizumi

Person

Omiya, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Imaging lens and imaging apparatus provided with the same
- Patent number 9,625,681
- Issue date Apr 18, 2017
- FUJIFILM Corporation
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Zoom lens and imaging apparatus
- Patent number 9,405,107
- Issue date Aug 2, 2016
- FUJIFILM Corporation
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Wide angle lens and imaging apparatus
- Patent number 9,389,399
- Issue date Jul 12, 2016
- FUJIFILM Corporation
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Imaging lens and imaging apparatus including the imaging lens
- Patent number 9,279,957
- Issue date Mar 8, 2016
- FUJIFILM Corporation
- Hideo Kanda
- G02 - OPTICS
Information Patent Grant
Wide angle lens and imaging apparatus
- Patent number 9,261,678
- Issue date Feb 16, 2016
- FUJIFILM Corporation
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Optical wave interference measuring apparatus
- Patent number 8,059,278
- Issue date Nov 15, 2011
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Optical wave interference measuring apparatus
- Patent number 7,982,882
- Issue date Jul 19, 2011
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Eyepiece for picture display device
- Patent number 6,414,798
- Issue date Jul 2, 2002
- Fuji Photo Optical Co., Ltd.
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Imaging lens for interferometric device
- Patent number 6,297,916
- Issue date Oct 2, 2001
- Fuji Photo Optical Co., Ltd.
- Hideo Kanda
- G02 - OPTICS
Information Patent Grant
Eyepiece lens for a display image observation device
- Patent number 6,181,479
- Issue date Jan 30, 2001
- Fuji Photo Optical Co., Ltd.
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Wide-angle eyepiece lens
- Patent number 6,166,861
- Issue date Dec 26, 2000
- Fuji Photo Optical Co., Ltd.
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Wide-field eyepiece
- Patent number 6,069,750
- Issue date May 30, 2000
- Fuji Photo Optical Co., Ltd.
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Eyepiece zoom lens system
- Patent number 5,663,834
- Issue date Sep 2, 1997
- Fuji Photo Optical Co. Ltd.
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Wide-field eyepiece with inside focus
- Patent number 5,612,823
- Issue date Mar 18, 1997
- Fuji Photo Optical Co., Ltd.
- Noboru Koizumi
- G02 - OPTICS
Information Patent Grant
Projection lens system for projectors
- Patent number 4,976,525
- Issue date Dec 11, 1990
- Fuji Photo Optical Co., Ltd.
- Takeshi Matsumura
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
IMAGING LENS AND IMAGING APPARATUS PROVIDED WITH THE SAME
- Publication number 20160011406
- Publication date Jan 14, 2016
- FUJIFILM CORPORATION
- NOBORU KOIZUMI
- G02 - OPTICS
Information Patent Application
ZOOM LENS AND IMAGING APPARATUS
- Publication number 20150160444
- Publication date Jun 11, 2015
- FUJIFILM CORPORATION
- Noboru KOIZUMI
- G02 - OPTICS
Information Patent Application
WIDE ANGLE LENS AND IMAGING APPARATUS
- Publication number 20150109690
- Publication date Apr 23, 2015
- FUJIFILM CORPORATION
- Noboru KOIZUMI
- G02 - OPTICS
Information Patent Application
WIDE ANGLE LENS AND IMAGING APPARATUS
- Publication number 20150109689
- Publication date Apr 23, 2015
- FUJIFILM CORPORATION
- Noboru KOIZUMI
- G02 - OPTICS
Information Patent Application
IMAGING LENS AND IMAGING APPARATUS INCLUDING THE IMAGING LENS
- Publication number 20140293452
- Publication date Oct 2, 2014
- FUJIFILM CORPORATION
- HIDEO KANDA
- G02 - OPTICS
Information Patent Application
LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS
- Publication number 20110304856
- Publication date Dec 15, 2011
- FUJIFILM CORPORATION
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASURING METHOD AND DEVICE
- Publication number 20100231923
- Publication date Sep 16, 2010
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVE INTERFERENCE MEASURING APPARATUS
- Publication number 20100097619
- Publication date Apr 22, 2010
- Zongtao GE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVE INTERFERENCE MEASURING APPARATUS
- Publication number 20100091299
- Publication date Apr 15, 2010
- Zongtao GE
- G01 - MEASURING TESTING

Noboru Koizumi

Person

Patents Grantslast 30 patents

Imaging lens and imaging apparatus provided with the same

Zoom lens and imaging apparatus

Wide angle lens and imaging apparatus

Imaging lens and imaging apparatus including the imaging lens

Wide angle lens and imaging apparatus

Optical wave interference measuring apparatus

Optical wave interference measuring apparatus

Eyepiece for picture display device

Imaging lens for interferometric device

Eyepiece lens for a display image observation device

Wide-angle eyepiece lens

Wide-field eyepiece

Eyepiece zoom lens system

Wide-field eyepiece with inside focus

Projection lens system for projectors

Patents Applicationslast 30 patents

IMAGING LENS AND IMAGING APPARATUS PROVIDED WITH THE SAME

ZOOM LENS AND IMAGING APPARATUS

WIDE ANGLE LENS AND IMAGING APPARATUS

WIDE ANGLE LENS AND IMAGING APPARATUS

IMAGING LENS AND IMAGING APPARATUS INCLUDING THE IMAGING LENS

LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS

THREE-DIMENSIONAL SHAPE MEASURING METHOD AND DEVICE

OPTICAL WAVE INTERFERENCE MEASURING APPARATUS

OPTICAL WAVE INTERFERENCE MEASURING APPARATUS