Noboru Morita

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Communication device and communication system
- Patent number 8,254,472
- Issue date Aug 28, 2012
- Fujitsu Limited
- Noboru Morita
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 7,910,474
- Issue date Mar 22, 2011
- NEC Corporation
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device having a multi-laye...
- Patent number 7,833,901
- Issue date Nov 16, 2010
- NEC Electronics Corporation
- Koichi Ohto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Organic insulating film, manufacturing method thereof, semiconducto...
- Patent number 7,763,979
- Issue date Jul 27, 2010
- NEC Electronics Corporation
- Koichi Ohto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Arithmetic method and function arithmetic circuit for a fast fourie...
- Patent number 7,634,524
- Issue date Dec 15, 2009
- Fujitsu Limited
- Shigeaki Okutani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lookup table and data acquisition method
- Patent number 7,620,676
- Issue date Nov 17, 2009
- Fujitsu Limited
- Shigeaki Okutani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 7,615,498
- Issue date Nov 10, 2009
- NEC Electronics Corporation
- Yoichi Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Carbon containing silicon oxide film having high ashing tolerance a...
- Patent number 7,582,970
- Issue date Sep 1, 2009
- NEC Electronics Corporation
- Sadayuki Ohnishi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Manufacturing method of semiconductor device
- Patent number 7,563,705
- Issue date Jul 21, 2009
- NEC Electronics Corporation
- Takashi Tonegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 7,482,263
- Issue date Jan 27, 2009
- NEC Electronics Corporation
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 7,473,630
- Issue date Jan 6, 2009
- NEC Electronics Corporation
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fourier transform apparatus
- Patent number 7,461,114
- Issue date Dec 2, 2008
- Fujitsu Limited
- Toshiro Nakazuru
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Carbon containing silicon oxide film having high ashing tolerance a...
- Patent number 7,420,279
- Issue date Sep 2, 2008
- NEC Electronics Corporation
- Sadayuki Ohnishi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,391,115
- Issue date Jun 24, 2008
- NEC Electronics Corporation
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing a semiconductor de...
- Patent number 7,180,191
- Issue date Feb 20, 2007
- NEC Electronics Corporation
- Yoichi Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 7,135,776
- Issue date Nov 14, 2006
- NEC Electronics Corporation
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having two distinct sioch layers
- Patent number 7,132,732
- Issue date Nov 7, 2006
- NEC Electronics Corporation
- Koichi Ohto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Carbon containing silicon oxide film having high ashing tolerance a...
- Patent number 7,102,236
- Issue date Sep 5, 2006
- NEC Electronics Corporation
- Sadayuki Ohnishi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of fabricating semiconductor device using plasma-enhanced CVD
- Patent number 7,074,698
- Issue date Jul 11, 2006
- NEC Electronics Corporation
- Noboru Morita
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 7,045,895
- Issue date May 16, 2006
- NEC Electronics Corporation
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Access control device and testing method
- Patent number 6,938,191
- Issue date Aug 30, 2005
- Fujitsu Limited
- Keiji Sato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMMUNICATION DEVICE, COMMUNICATION SYSTEM, AND COMMUNICATION METHOD
- Publication number 20100128763
- Publication date May 27, 2010
- FUJITSU LIMITED
- Noboru Morita
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CARBON CONTAINING SILICON OXIDE FILM HAVING HIGH ASHING TOLERANCE A...
- Publication number 20080290522
- Publication date Nov 27, 2008
- NEC Electronics Corporation
- Sadayuki Ohnishi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20080194102
- Publication date Aug 14, 2008
- NEC Electronics Corporation
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORGANIC INSULATING FILM, MANUFACTURING METHOD THEREOF, SEMICONDUCTO...
- Publication number 20070246804
- Publication date Oct 25, 2007
- Koichi Ohto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method of manufacturing a semiconductor device
- Publication number 20070117405
- Publication date May 24, 2007
- NEC ELECTRONICS CORPORATION
- Yoichi Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device, and production method for manufacturing such...
- Publication number 20070045861
- Publication date Mar 1, 2007
- NEC ELECTRONICS CORPORATION
- Koichi Ohto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing same
- Publication number 20070032070
- Publication date Feb 8, 2007
- NEC ELECTRONICS CORPORATION
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Carbon containing silicon oxide film having high ashing tolerance a...
- Publication number 20060255466
- Publication date Nov 16, 2006
- Sadayuki Ohnishi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Lookup table and data acquisition method
- Publication number 20060190515
- Publication date Aug 24, 2006
- FUJITSU LIMITED
- Shigeaki Okutani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20060166488
- Publication date Jul 27, 2006
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Manufacturing method of semiconductor device
- Publication number 20060141778
- Publication date Jun 29, 2006
- NEC Electronics Corporation
- Takashi Tonegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing same
- Publication number 20060060975
- Publication date Mar 23, 2006
- NEC ELECTRONICS CORPORATION
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing a semiconductor de...
- Publication number 20050170633
- Publication date Aug 4, 2005
- NEC Electronics Corporation
- Yoichi Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Function arithmetic method and function arithmetic circuit
- Publication number 20050131975
- Publication date Jun 16, 2005
- FUJITSU LIMITED
- Shigeaki Okutani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Carbon containing silicon oxide film having high ashing tolerance a...
- Publication number 20050006665
- Publication date Jan 13, 2005
- Sadayuki Ohnishi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor device, and production method for manufacturing such...
- Publication number 20040183162
- Publication date Sep 23, 2004
- NEC ELECTRONICS CORPORATION
- Koichi Ohto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fabricating semiconductor device using Plasma-Enhanced CVD
- Publication number 20040185668
- Publication date Sep 23, 2004
- NEC Electronics Corporation
- Noboru Morita
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20040155342
- Publication date Aug 12, 2004
- NEC Electronics Corporation
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20040150110
- Publication date Aug 5, 2004
- NEC Electronics Corporation
- Tatsuya Usami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Organic insulating film, manufacturing method thereof, semiconducto...
- Publication number 20040152334
- Publication date Aug 5, 2004
- NEC Electonics Corporation
- Koichi Ohto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Fourier transform apparatus
- Publication number 20040039765
- Publication date Feb 26, 2004
- FUJITSU LIMITED
- Toshiro Nakazuru
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Manufacturing method of semiconductor device
- Publication number 20030155657
- Publication date Aug 21, 2003
- NEC Electronics Corporation
- Takashi Tonegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Access control device and testing method
- Publication number 20030046619
- Publication date Mar 6, 2003
- FUJITSU LIMITED
- Keiji Sato
- G01 - MEASURING TESTING

Noboru Morita

Person

Patents Grantslast 30 patents

Communication device and communication system

Method of manufacturing a semiconductor device

Method for manufacturing a semiconductor device having a multi-laye...

Organic insulating film, manufacturing method thereof, semiconducto...

Arithmetic method and function arithmetic circuit for a fast fourie...

Lookup table and data acquisition method

Method of manufacturing a semiconductor device

Carbon containing silicon oxide film having high ashing tolerance a...

Manufacturing method of semiconductor device

Semiconductor device and method for manufacturing the same

Semiconductor device and method for manufacturing same

Fourier transform apparatus

Carbon containing silicon oxide film having high ashing tolerance a...

Semiconductor device and manufacturing method thereof

Semiconductor device and method of manufacturing a semiconductor de...

Semiconductor device and method for manufacturing same

Semiconductor device having two distinct sioch layers

Carbon containing silicon oxide film having high ashing tolerance a...

Method of fabricating semiconductor device using plasma-enhanced CVD

Semiconductor device and method for manufacturing the same

Access control device and testing method

Patents Applicationslast 30 patents

COMMUNICATION DEVICE, COMMUNICATION SYSTEM, AND COMMUNICATION METHOD

CARBON CONTAINING SILICON OXIDE FILM HAVING HIGH ASHING TOLERANCE A...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

ORGANIC INSULATING FILM, MANUFACTURING METHOD THEREOF, SEMICONDUCTO...

Method of manufacturing a semiconductor device

Semiconductor device, and production method for manufacturing such...

Semiconductor device and method for manufacturing same

Carbon containing silicon oxide film having high ashing tolerance a...

Lookup table and data acquisition method

Semiconductor device and method for manufacturing the same

Manufacturing method of semiconductor device

Semiconductor device and method for manufacturing same

Semiconductor device and method of manufacturing a semiconductor de...

Function arithmetic method and function arithmetic circuit

Carbon containing silicon oxide film having high ashing tolerance a...

Semiconductor device, and production method for manufacturing such...

Method of fabricating semiconductor device using Plasma-Enhanced CVD

Semiconductor device and manufacturing method thereof

Semiconductor device and method for manufacturing the same

Organic insulating film, manufacturing method thereof, semiconducto...

Fourier transform apparatus

Manufacturing method of semiconductor device

Access control device and testing method