Noboru OKINO

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testing apparatus
- Patent number 8,207,744
- Issue date Jun 26, 2012
- Advantest Corporation
- Noboru Okino
- G01 - MEASURING TESTING
Information Patent Grant
Memory testing method and memory testing apparatus
- Patent number 6,877,118
- Issue date Apr 5, 2005
- Advantest Corporation
- Hiromi Oshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory testing method and apparatus
- Patent number 6,836,863
- Issue date Dec 28, 2004
- Advantest Corporation
- Makoto Tabata
- G11 - INFORMATION STORAGE
Information Patent Grant
Analyzing device for saving semiconductor memory failures
- Patent number 5,410,687
- Issue date Apr 25, 1995
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Sequential logic circuit device
- Patent number 5,140,176
- Issue date Aug 18, 1992
- Advantest Corporation
- Noboru Okino
- G05 - CONTROLLING REGULATING
Information Patent Grant
Pattern generator
- Patent number 4,670,879
- Issue date Jun 2, 1987
- Takeda Riken Kogyo Kabushikikaisha
- Noboru Okino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Testing Apparatus
- Publication number 20100156434
- Publication date Jun 24, 2010
- Advantest Corporation
- Noboru OKINO
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory testing method and apparatus
- Publication number 20020054528
- Publication date May 9, 2002
- Makoto Tabata
- G11 - INFORMATION STORAGE
Information Patent Application
Memory testing method and memory testing apparatus
- Publication number 20010052093
- Publication date Dec 13, 2001
- Japan Aviation Electronics Industry Limited
- Hiromi Oshima
- G11 - INFORMATION STORAGE