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Noboru OTABE
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Multilayer wiring base plate and probe card using the same
Patent number
11,099,227
Issue date
Aug 24, 2021
Kabushiki Kaisha Nihon Micronics
Noboru Otabe
G01 - MEASURING TESTING
Information
Patent Grant
Probe card
Patent number
10,705,122
Issue date
Jul 7, 2020
Kabushiki Kaisha Nihon Micronics
Yoshiyuki Fukami
G01 - MEASURING TESTING
Information
Patent Grant
Multilayer wiring base plate and probe card using the same
Patent number
9,271,393
Issue date
Feb 23, 2016
Kabushiki Kaisha Nihon Micronics
Noboru Otabe
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for manufacturing electric film body
Patent number
9,113,546
Issue date
Aug 18, 2015
Kabushiki Kaisha Nihon Micronics
Takayasu Sugai
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
ELECTRICAL CONNECTING APPARATUS
Publication number
20220149549
Publication date
May 12, 2022
Kabushiki Kaisha Nihon Micronics
Shou HARAKO
G01 - MEASURING TESTING
Information
Patent Application
MULTILAYER WIRING BASE PLATE AND PROBE CARD USING THE SAME
Publication number
20200400739
Publication date
Dec 24, 2020
Kabushiki Kaisha Nihon Micronics
Noboru OTABE
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD
Publication number
20190154730
Publication date
May 23, 2019
Kabushiki Kaisha Nihon Micronics
Yoshiyuki FUKAMI
G01 - MEASURING TESTING
Information
Patent Application
MULTILAYER WIRING BASE PLATE AND PROBE CARD USING THE SAME
Publication number
20140118017
Publication date
May 1, 2014
Noboru OTABE
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD FOR MANUFACTURING ELECTRIC FILM BODY
Publication number
20140072780
Publication date
Mar 13, 2014
Kabushiki Kaisha Nihon Micronics
Takayasu SUGAI
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR