Nobuaki Hirose

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection apparatus and defect inspection program
- Patent number 12,112,963
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 12,039,716
- Issue date Jul 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 11,788,973
- Issue date Oct 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection information generation device, inspection information ge...
- Patent number 11,041,815
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Takahiro Urano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,902,417
- Issue date Dec 2, 2014
- Hitachi High-Technologies Corporation
- Nobuaki Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting apparatus and defect inspecting method
- Patent number 8,564,767
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Hideki Fukushima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Defect Inspection Method and Defect Inspection Device
- Publication number 20220301136
- Publication date Sep 22, 2022
- Takashi HIROI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Program
- Publication number 20220084856
- Publication date Mar 17, 2022
- Hitachi High-Tech Corporation
- Takashi HIROI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Device and Defect Inspection Method
- Publication number 20210381989
- Publication date Dec 9, 2021
- Hitachi High-Tech Corporation
- Takashi HIROI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION INFORMATION GENERATION DEVICE, INSPECTION INFORMATION GE...
- Publication number 20190154593
- Publication date May 23, 2019
- Hitachi High-Technologies Corporation
- Takahiro URANO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20130271754
- Publication date Oct 17, 2013
- Hitachi High-Technologies Corporation
- Nobuaki Hirose
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTING APPARATUS AND DEFECT INSPECTING METHOD
- Publication number 20130208270
- Publication date Aug 15, 2013
- Hitachi High-Technologies Corporation
- Hideki Fukushima
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20120176493
- Publication date Jul 12, 2012
- Nobuaki Hirose
- G01 - MEASURING TESTING

Nobuaki Hirose

Person

Patents Grantslast 30 patents

Defect inspection apparatus and defect inspection program

Defect inspection method and defect inspection device

Defect inspection device and defect inspection method

Inspection information generation device, inspection information ge...

Inspection apparatus

Defect inspecting apparatus and defect inspecting method

Patents Applicationslast 30 patents

Defect Inspection Method and Defect Inspection Device

Defect Inspection Apparatus and Defect Inspection Program

Defect Inspection Device and Defect Inspection Method

INSPECTION INFORMATION GENERATION DEVICE, INSPECTION INFORMATION GE...

INSPECTION APPARATUS

DEFECT INSPECTING APPARATUS AND DEFECT INSPECTING METHOD

INSPECTION APPARATUS AND INSPECTION METHOD