Nobuaki SAKAI

Person

Hachioji-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Atomic force microscope, atomic force microscopy, and controlling m...
- Patent number 10,928,417
- Issue date Feb 23, 2021
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope and control method of the same
- Patent number 10,161,959
- Issue date Dec 25, 2018
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope and control method of the same
- Patent number 10,107,833
- Issue date Oct 23, 2018
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and control method thereof
- Patent number 9,977,049
- Issue date May 22, 2018
- Olympus Corporation
- Nobuaki Sakai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning mechanism and scanning probe microscope
- Patent number 9,625,491
- Issue date Apr 18, 2017
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning mechanism and scanning probe microscope
- Patent number 9,519,005
- Issue date Dec 13, 2016
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 9,482,690
- Issue date Nov 1, 2016
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and scanning probe microscopy
- Patent number 9,453,856
- Issue date Sep 27, 2016
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Compound microscope
- Patent number 9,347,969
- Issue date May 24, 2016
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and control method thereof
- Patent number 9,335,341
- Issue date May 10, 2016
- Olympus Corporation
- Nobuaki Sakai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning mechanism and scanning probe microscope
- Patent number 9,170,272
- Issue date Oct 27, 2015
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanner driving apparatus and optical scanner driving method
- Patent number 7,085,030
- Issue date Aug 1, 2006
- Olympus Corporation
- Nobuaki Sakai
- G02 - OPTICS
Information Patent Grant
Microscope system
- Patent number 6,980,359
- Issue date Dec 27, 2005
- Olympus Optical Co., Ltd.
- Takashi Yoneyama
- G02 - OPTICS
Information Patent Grant
Driving circuit for an optical scanner
- Patent number 6,775,039
- Issue date Aug 10, 2004
- Olympus Corporation
- Nobuaki Sakai
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
ATOMIC FORCE MICROSCOPE, ATOMIC FORCE MICROSCOPY, AND CONTROLLING M...
- Publication number 20200081032
- Publication date Mar 12, 2020
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION METHOD USING COMPOUND MICROSCOPE INCLUDING AN INVERTED...
- Publication number 20190011478
- Publication date Jan 10, 2019
- OLYMPUS CORPORATION
- Yoshitsugu UEKUSA
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE AND CONTROL METHOD OF THE SAME
- Publication number 20180143220
- Publication date May 24, 2018
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE AND CONTROL METHOD OF THE SAME
- Publication number 20180120343
- Publication date May 3, 2018
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION ACQUIRING METHOD IN ATOMIC FORCE MICROSCOPE
- Publication number 20180074092
- Publication date Mar 15, 2018
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND CONTROL METHOD THEREOF
- Publication number 20160216293
- Publication date Jul 28, 2016
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPY
- Publication number 20160025770
- Publication date Jan 28, 2016
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE
- Publication number 20160011230
- Publication date Jan 14, 2016
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE
- Publication number 20150153385
- Publication date Jun 4, 2015
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20150135374
- Publication date May 14, 2015
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND MICROSCOPE WITH SCANNING PROBE MICROSCOPE AND OPTICAL MICR...
- Publication number 20150047080
- Publication date Feb 12, 2015
- OLYMPUS CORPORATION
- Akira YAGI
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND MICROSCOPE
- Publication number 20150040273
- Publication date Feb 5, 2015
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE
- Publication number 20150020243
- Publication date Jan 15, 2015
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND CONTROL METHOD THEREOF
- Publication number 20140223613
- Publication date Aug 7, 2014
- OLYMPUS CORPORATION
- Nobuaki SAKAI
- B82 - NANO-TECHNOLOGY
Information Patent Application
Microscope system
- Publication number 20040169915
- Publication date Sep 2, 2004
- Olympus Optical Co., Ltd.
- Takashi Yoneyama
- G02 - OPTICS
Information Patent Application
Microscope system
- Publication number 20020176161
- Publication date Nov 28, 2002
- Olympus Optical Co., Ltd.
- Takashi Yoneyama
- G02 - OPTICS
Information Patent Application
Optical scanner driving apparatus and optical scanner driving method
- Publication number 20020163675
- Publication date Nov 7, 2002
- Olympus Optical Co., Ltd.
- Nobuaki Sakai
- G02 - OPTICS

Nobuaki SAKAI

Person

Patents Grantslast 30 patents

Atomic force microscope, atomic force microscopy, and controlling m...

Atomic force microscope and control method of the same

Atomic force microscope and control method of the same

Scanning probe microscope and control method thereof

Scanning mechanism and scanning probe microscope

Scanning mechanism and scanning probe microscope

Scanning probe microscope

Scanning probe microscope and scanning probe microscopy

Compound microscope

Scanning probe microscope and control method thereof

Scanning mechanism and scanning probe microscope

Optical scanner driving apparatus and optical scanner driving method

Microscope system

Driving circuit for an optical scanner

Patents Applicationslast 30 patents

ATOMIC FORCE MICROSCOPE, ATOMIC FORCE MICROSCOPY, AND CONTROLLING M...

OBSERVATION METHOD USING COMPOUND MICROSCOPE INCLUDING AN INVERTED...

ATOMIC FORCE MICROSCOPE AND CONTROL METHOD OF THE SAME

ATOMIC FORCE MICROSCOPE AND CONTROL METHOD OF THE SAME

INFORMATION ACQUIRING METHOD IN ATOMIC FORCE MICROSCOPE

SCANNING PROBE MICROSCOPE AND CONTROL METHOD THEREOF

SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPY

SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE

SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE

COMPOUND MICROSCOPE WITH SCANNING PROBE MICROSCOPE AND OPTICAL MICR...

COMPOUND MICROSCOPE

SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE AND CONTROL METHOD THEREOF

Microscope system

Microscope system

Optical scanner driving apparatus and optical scanner driving method