Nobuaki Ueki

Person

Saitama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Lens device, camera system, and aberration correction unit
- Patent number 10,437,028
- Issue date Oct 8, 2019
- FUJIFILM Corporation
- Nobuaki Ueki
- G02 - OPTICS
Information Patent Grant
Apparatus for measuring rotationally symmetric aspheric surface
- Patent number 8,526,009
- Issue date Sep 3, 2013
- FUJIFILM Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Aspheric lens surface-decenter measuring method and apparatus
- Patent number 7,760,365
- Issue date Jul 20, 2010
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric apparatus for measuring moving object and optical i...
- Patent number 7,580,133
- Issue date Aug 25, 2009
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Light intensity ratio adjustment filter for an interferometer, inte...
- Patent number 7,375,825
- Issue date May 20, 2008
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for holding subject and measuring instrument equi...
- Patent number 7,340,962
- Issue date Mar 11, 2008
- Fujinon Corporation
- Nobuaki Ueki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for measuring holding distortion
- Patent number 7,342,666
- Issue date Mar 11, 2008
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for measuring virtual contact surfaces
- Patent number 7,233,400
- Issue date Jun 19, 2007
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer apparatus for both low and high coherence measuremen...
- Patent number 6,992,779
- Issue date Jan 31, 2006
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Phase unwrapping method for fringe image analysis
- Patent number 6,985,605
- Issue date Jan 10, 2006
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Spherical form measuring and analyzing method
- Patent number 6,912,055
- Issue date Jun 28, 2005
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Moiré grating noise eliminating method
- Patent number 6,867,871
- Issue date Mar 15, 2005
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Imaging optical system for oblique incidence interferometer
- Patent number 6,744,523
- Issue date Jun 1, 2004
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Flatness measuring and analyzing method
- Patent number 6,018,990
- Issue date Feb 1, 2000
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LENS DEVICE, CAMERA SYSTEM, AND ABERRATION CORRECTION UNIT
- Publication number 20180203213
- Publication date Jul 19, 2018
- FUJIFILM CORPORATION
- Nobuaki UEKI
- G02 - OPTICS
Information Patent Application
APPARATUS FOR MEASURING SURFACE MISALIGNMENT AND ANGULAR MISALIGNMENT
- Publication number 20110304855
- Publication date Dec 15, 2011
- FUJIFILM CORPORATION
- Nobuaki UEKI
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME INTERFEROMETER
- Publication number 20110299090
- Publication date Dec 8, 2011
- FUJIFILM CORPORATION
- Nobuaki UEKI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING ROTATIONALLY SYMMETRIC ASPHERIC SURFACE
- Publication number 20110279823
- Publication date Nov 17, 2011
- FUJIFILM CORPORATION
- Nobuaki UEKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR READING REPRODUCED IMAGE
- Publication number 20110042591
- Publication date Feb 24, 2011
- Minoru Kurose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASPHERIC LENS SURFACE-DECENTER MEASURING METHOD AND APPARATUS
- Publication number 20080304080
- Publication date Dec 11, 2008
- Nobuaki UEKI
- G01 - MEASURING TESTING
Information Patent Application
Vibration-resistant interferometer apparatus
- Publication number 20070146724
- Publication date Jun 28, 2007
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Interferometric apparatus for measuring moving object and optical i...
- Publication number 20070002333
- Publication date Jan 4, 2007
- FUJINON CORPORATION
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring holding distortion
- Publication number 20060126077
- Publication date Jun 15, 2006
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Method and device for holding subject and measuring instrument equi...
- Publication number 20060086193
- Publication date Apr 27, 2006
- Fujinon Corporation
- Nobuaki Ueki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Light intensity ratio adjustment filter for an interferometer, inte...
- Publication number 20060066874
- Publication date Mar 30, 2006
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Interferometer for measuring virtual contact surfaces
- Publication number 20060044567
- Publication date Mar 2, 2006
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Vibration-resistant interferometer apparatus
- Publication number 20050036152
- Publication date Feb 17, 2005
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Interferometer apparatus for both low and high coherence measuremen...
- Publication number 20040141184
- Publication date Jul 22, 2004
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Spherical form measuring and analyzing method
- Publication number 20030184763
- Publication date Oct 2, 2003
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Moire grating noise eliminating method
- Publication number 20030184766
- Publication date Oct 2, 2003
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Phase unwrapping method for fringe image analysis
- Publication number 20030035566
- Publication date Feb 20, 2003
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Imaging optical system for oblique incidence interferometer
- Publication number 20020140944
- Publication date Oct 3, 2002
- Fuji Photo Optical Co., Ltd.
- Nobuaki Ueki
- G01 - MEASURING TESTING

Nobuaki Ueki

Person

Patents Grantslast 30 patents

Lens device, camera system, and aberration correction unit

Apparatus for measuring rotationally symmetric aspheric surface

Aspheric lens surface-decenter measuring method and apparatus

Interferometric apparatus for measuring moving object and optical i...

Light intensity ratio adjustment filter for an interferometer, inte...

Method and device for holding subject and measuring instrument equi...

Method and apparatus for measuring holding distortion

Interferometer for measuring virtual contact surfaces

Interferometer apparatus for both low and high coherence measuremen...

Phase unwrapping method for fringe image analysis

Spherical form measuring and analyzing method

Moiré grating noise eliminating method

Imaging optical system for oblique incidence interferometer

Flatness measuring and analyzing method

Patents Applicationslast 30 patents

LENS DEVICE, CAMERA SYSTEM, AND ABERRATION CORRECTION UNIT

APPARATUS FOR MEASURING SURFACE MISALIGNMENT AND ANGULAR MISALIGNMENT

REAL-TIME INTERFEROMETER

APPARATUS FOR MEASURING ROTATIONALLY SYMMETRIC ASPHERIC SURFACE

METHOD AND DEVICE FOR READING REPRODUCED IMAGE

ASPHERIC LENS SURFACE-DECENTER MEASURING METHOD AND APPARATUS

Vibration-resistant interferometer apparatus

Interferometric apparatus for measuring moving object and optical i...

Method and apparatus for measuring holding distortion

Method and device for holding subject and measuring instrument equi...

Light intensity ratio adjustment filter for an interferometer, inte...

Interferometer for measuring virtual contact surfaces

Vibration-resistant interferometer apparatus

Interferometer apparatus for both low and high coherence measuremen...

Spherical form measuring and analyzing method

Moire grating noise eliminating method

Phase unwrapping method for fringe image analysis

Imaging optical system for oblique incidence interferometer