Nobuaki YAMANAKA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Film thickness measuring apparatus
- Patent number 10,677,585
- Issue date Jun 9, 2020
- Mitsubishi Electric Corporation
- Yuichi Masumoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 10,242,876
- Issue date Mar 26, 2019
- Mitsubishi Electric Corporation
- Daisuke Chikamori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 10,211,056
- Issue date Feb 19, 2019
- Mitsubishi Electric Corporation
- Nobuaki Yamanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for producing the same
- Patent number 10,074,578
- Issue date Sep 11, 2018
- Mitsubishi Electric Corporation
- Nobuaki Yamanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 9,881,818
- Issue date Jan 30, 2018
- Mitsubishi Electric Corporation
- Nobuaki Yamanaka
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor device having an improved contact structure and a man...
- Patent number 6,346,482
- Issue date Feb 12, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Junko Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FILM THICKNESS MEASURING APPARATUS
- Publication number 20190310074
- Publication date Oct 10, 2019
- Mitsubishi Electric Corporation
- Yuichi MASUMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20180019130
- Publication date Jan 18, 2018
- Mitsubishi Electric Corporation
- Daisuke CHIKAMORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING THE SAME
- Publication number 20170352600
- Publication date Dec 7, 2017
- Mitsubishi Electric Corporation
- Nobuaki YAMANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20170154798
- Publication date Jun 1, 2017
- Mitsubishi Electric Corporation
- Nobuaki YAMANAKA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20160351396
- Publication date Dec 1, 2016
- Mitsubishi Electric Corporation
- Nobuaki YAMANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING AN IMPROVED CONTACT STRUCTURE AND A MAN...
- Publication number 20010041450
- Publication date Nov 15, 2001
- JUNKO MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS