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Nobuchika Matsui
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Wakayama-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Impulse immunity test apparatus
Patent number
8,410,791
Issue date
Apr 2, 2013
NEC Corporation
Tsuneo Tsukagoshi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
IMPULSE IMMUNITY TEST APPARATUS
Publication number
20100090710
Publication date
Apr 15, 2010
NEC Corporation
Tsuneo Tsukagoshi
G01 - MEASURING TESTING