Nobue ARAKI

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Kitakanbara-gun, Niigata, JP

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Patents Grantslast 30 patents

Information Patent Grant
Evaluation method of metal contamination
- Patent number 11,538,721
- Issue date Dec 27, 2022
- Globalwafers Japan Co., Ltd
- Nobue Araki
- C30 - CRYSTAL GROWTH
Information Patent Grant
Evaluation method of silicon wafer
- Patent number 11,060,983
- Issue date Jul 13, 2021
- Globalwafers Japan Co., Ltd
- Haruo Sudo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EVALUATION METHOD OF METAL CONTAMINATION
- Publication number 20210082774
- Publication date Mar 18, 2021
- GlobalWafers Japan Co., Ltd.
- Nobue ARAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION METHOD OF SILICON WAFER
- Publication number 20210055232
- Publication date Feb 25, 2021
- GlobalWafers Japan Co., Ltd.
- Haruo SUDO
- G01 - MEASURING TESTING