Nobuei Washizu

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus
- Patent number 11,181,504
- Issue date Nov 23, 2021
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Grant
Clock generating apparatus, test apparatus and clock generating method
- Patent number 8,897,395
- Issue date Nov 25, 2014
- Advantest Corporation
- Nobuei Washizu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Receiving apparatus, test apparatus, receiving method and test method
- Patent number 8,605,825
- Issue date Dec 10, 2013
- Advantest Corporation
- Nobuei Washizu
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus, test method and manufacturing method
- Patent number 8,373,433
- Issue date Feb 12, 2013
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Grant
Waveform generator
- Patent number 7,973,584
- Issue date Jul 5, 2011
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, configuration method, and device interface
- Patent number 7,913,002
- Issue date Mar 22, 2011
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and testing method
- Patent number 7,759,927
- Issue date Jul 20, 2010
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and testing method
- Patent number 7,193,407
- Issue date Mar 20, 2007
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and testing method
- Patent number 7,190,155
- Issue date Mar 13, 2007
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Grant
Test device and test module
- Patent number 6,992,576
- Issue date Jan 31, 2006
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROFLUIDIC DEVICE AND MICROPARTICLE MEASUREMENT SYSTEM
- Publication number 20250010292
- Publication date Jan 9, 2025
- Advantest Corporation
- Nobuei WASHIZU
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
PORE CHIP AND MICROPARTICLE MEASUREMENT SYSTEM
- Publication number 20240183769
- Publication date Jun 6, 2024
- ADVANTEST CORPORATION
- Kosuke OINUMA
- G01 - MEASURING TESTING
Information Patent Application
PORE DEVICE AND FINE PARTICLE MEASUREMENT SYSTEM
- Publication number 20240125688
- Publication date Apr 18, 2024
- Advantest Corporation
- Yasuharu IMAI
- G01 - MEASURING TESTING
Information Patent Application
FINE PARTICLE MEASURING SYSTEM
- Publication number 20220252544
- Publication date Aug 11, 2022
- Advantest Corporation
- Hiroshi SATO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20200033292
- Publication date Jan 30, 2020
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Application
RECEIVING APPARATUS, TEST APPARATUS, RECEIVING METHOD AND TEST METHOD
- Publication number 20120194251
- Publication date Aug 2, 2012
- Advantest Corporation
- Nobuei Washizu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CLOCK GENERATING APPARATUS, TEST APPARATUS AND CLOCK GENERATING METHOD
- Publication number 20120182026
- Publication date Jul 19, 2012
- Advantest Corporation
- Nobuei WASHIZU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RECEIVING APPARATUS, TEST APPARATUS, RECEIVING METHOD, AND TEST METHOD
- Publication number 20120013343
- Publication date Jan 19, 2012
- Advantest Corporation
- Nobuei WASHIZU
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD AND MANUFACTURING METHOD
- Publication number 20100207640
- Publication date Aug 19, 2010
- Advantest Corporation
- Nobuei WASHIZU
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM GENERATOR
- Publication number 20100194460
- Publication date Aug 5, 2010
- Advantest Corporation
- Nobuei Washizu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Test apparatus and testing method
- Publication number 20070052427
- Publication date Mar 8, 2007
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TESTING METHOD
- Publication number 20070035289
- Publication date Feb 15, 2007
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TESTING METHOD
- Publication number 20070035288
- Publication date Feb 15, 2007
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus, configuration method, and device interface
- Publication number 20060041694
- Publication date Feb 23, 2006
- Advantest Corporation
- Nobuei Washizu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test device and test module
- Publication number 20050024062
- Publication date Feb 3, 2005
- Advantest Corporation
- Nobuei Washizu
- G01 - MEASURING TESTING

Nobuei Washizu

Person

Patents Grantslast 30 patents

Measurement apparatus

Clock generating apparatus, test apparatus and clock generating method

Receiving apparatus, test apparatus, receiving method and test method

Test apparatus, test method and manufacturing method

Waveform generator

Test apparatus, configuration method, and device interface

Test apparatus and testing method

Test apparatus and testing method

Test apparatus and testing method

Test device and test module

Patents Applicationslast 30 patents

MICROFLUIDIC DEVICE AND MICROPARTICLE MEASUREMENT SYSTEM

PORE CHIP AND MICROPARTICLE MEASUREMENT SYSTEM

PORE DEVICE AND FINE PARTICLE MEASUREMENT SYSTEM

FINE PARTICLE MEASURING SYSTEM

MEASUREMENT APPARATUS

RECEIVING APPARATUS, TEST APPARATUS, RECEIVING METHOD AND TEST METHOD

CLOCK GENERATING APPARATUS, TEST APPARATUS AND CLOCK GENERATING METHOD

RECEIVING APPARATUS, TEST APPARATUS, RECEIVING METHOD, AND TEST METHOD

TEST APPARATUS, TEST METHOD AND MANUFACTURING METHOD

WAVEFORM GENERATOR

Test apparatus and testing method

TEST APPARATUS AND TESTING METHOD

TEST APPARATUS AND TESTING METHOD

Test apparatus, configuration method, and device interface

Test device and test module