Nobuhiko Aoki

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Plate thickness measuring method and apparatus
- Patent number 4,564,296
- Issue date Jan 14, 1986
- Hitachi, Ltd.
- Yoshitada Oshida
- G01 - MEASURING TESTING
Information Patent Grant
Pattern detection system
- Patent number 4,508,453
- Issue date Apr 2, 1985
- Hitachi, Ltd.
- Yasuhiko Hara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exterior view examination apparatus
- Patent number 4,447,731
- Issue date May 8, 1984
- Hitachi, Ltd.
- Asahiro Kuni
- H01 - BASIC ELECTRIC ELEMENTS