Nobuhiko SASAKI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis device
- Patent number 11,971,426
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Rei Konishi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automatic analysis system
- Patent number 11,796,553
- Issue date Oct 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Nobuhiko Sasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE RESTRICTION METHOD, RECORDING MEDIUM, INFORMATION PROCESSING...
- Publication number 20220383472
- Publication date Dec 1, 2022
- TOKYO ELECTRON LIMITED
- Kazuhisa NAKAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC ANALYSIS SYSTEM
- Publication number 20210293841
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH CORPORATION
- Nobuhiko SASAKI
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analysis Device
- Publication number 20200278366
- Publication date Sep 3, 2020
- Hitachi High-Technologies Corporation
- Rei KONISHI
- G01 - MEASURING TESTING