Nobuhiko Yamabe

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Atomic flux measurement device
- Patent number 9,658,191
- Issue date May 23, 2017
- The Doshisha
- Tadashi Ohachi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
ATOMIC FLUX MEASUREMENT DEVICE
- Publication number 20130124124
- Publication date May 16, 2013
- ARIOS INC.
- Tadashi OHACHI
- C30 - CRYSTAL GROWTH