Nobuhiro ISHIKAWA

Person

Ibaraki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Coordinate measuring machine and coordinate correction method
- Patent number 10,429,166
- Issue date Oct 1, 2019
- Mitutoyo Corporation
- Hideyuki Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate correction method and coordinate measuring machine
- Patent number 10,429,167
- Issue date Oct 1, 2019
- Mitutoyo Corporation
- Hideyuki Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measuring machine and coordinate correction method
- Patent number 10,422,636
- Issue date Sep 24, 2019
- Mitutoyo Corporation
- Hideyuki Nakagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring probe
- Patent number 10,415,949
- Issue date Sep 17, 2019
- Mitutoyo Corporation
- Satoshi Koga
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe
- Patent number 10,393,495
- Issue date Aug 27, 2019
- Mitutoyo Corporation
- Satoshi Koga
- G01 - MEASURING TESTING
Information Patent Grant
Sensor signal contact detector circuit
- Patent number 10,006,803
- Issue date Jun 26, 2018
- Mituoyo Corporation
- Nobuhiro Ishikawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Coordinate measuring machine and method for calculating correction...
- Patent number 9,746,303
- Issue date Aug 29, 2017
- Mitutoyo Corporation
- Hideyuki Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Form measuring machine and form measuring method
- Patent number 9,719,779
- Issue date Aug 1, 2017
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of correcting measurement error of shape measuring apparatus...
- Patent number 9,683,839
- Issue date Jun 20, 2017
- Mitutoyo Corporation
- Hideyuki Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus and shape measurement error correction me...
- Patent number 9,464,877
- Issue date Oct 11, 2016
- Mitutoyo Corporation
- Hideyuki Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring machine and method of correcting shape measurement...
- Patent number 9,097,504
- Issue date Aug 4, 2015
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring machine and method of correcting shape measurement...
- Patent number 9,091,522
- Issue date Jul 28, 2015
- Mitutoyo Corporation
- Hideyuki Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Image sensor, attitude detector, contact probe, and multi-sensing p...
- Patent number 9,062,958
- Issue date Jun 23, 2015
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Surface-profile measuring instrument
- Patent number 7,660,688
- Issue date Feb 9, 2010
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Control device
- Patent number 7,471,056
- Issue date Dec 30, 2008
- Mitutoyo Corporation
- Shingo Kiyotani
- G05 - CONTROLLING REGULATING
Information Patent Grant
Measuring apparatus, method of measuring surface texture and comput...
- Patent number 7,464,481
- Issue date Dec 16, 2008
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Position control device, measuring device and machining device
- Patent number 7,319,909
- Issue date Jan 15, 2008
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G05 - CONTROLLING REGULATING
Information Patent Grant
Amplitude-detecting method and circuit
- Patent number 6,937,070
- Issue date Aug 30, 2005
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring optical wavelength
- Patent number 6,507,404
- Issue date Jan 14, 2003
- Mitutoyo Corporation
- Nobuhisa Nishioki
- G01 - MEASURING TESTING
Information Patent Grant
Touch signal probe
- Patent number 6,360,176
- Issue date Mar 19, 2002
- Mitutoyo Corporation
- Nobuhisa Nishioki
- G01 - MEASURING TESTING
Information Patent Grant
Non-directional touch signal probe
- Patent number 6,215,225
- Issue date Apr 10, 2001
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method and measuring instrument
- Patent number 6,044,569
- Issue date Apr 4, 2000
- Mitutoyo Corporation
- Motonori Ogihara
- G05 - CONTROLLING REGULATING
Information Patent Grant
DC level transition detecting circuit for sensor devices
- Patent number 5,949,257
- Issue date Sep 7, 1999
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Amplitude detecting device
- Patent number 5,922,964
- Issue date Jul 13, 1999
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COORDINATE MEASURING MACHINE AND COORDINATE CORRECTION METHOD
- Publication number 20180058832
- Publication date Mar 1, 2018
- MITUTOYO CORPORATION
- Hideyuki NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING MACHINE AND COORDINATE CORRECTION METHOD
- Publication number 20180058847
- Publication date Mar 1, 2018
- MITUTOYO CORPORATION
- Hideyuki NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE CORRECTION METHOD AND COORDINATE MEASURING MACHINE
- Publication number 20180058834
- Publication date Mar 1, 2018
- MITUTOYO CORPORATION
- Hideyuki NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20170248400
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Satoshi KOGA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20170248402
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Satoshi KOGA
- G01 - MEASURING TESTING
Information Patent Application
FORM MEASURING MACHINE AND FORM MEASURING METHOD
- Publication number 20160131470
- Publication date May 12, 2016
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CORRECTING MEASUREMENT ERROR OF SHAPE MEASURING APPARATUS...
- Publication number 20160018218
- Publication date Jan 21, 2016
- MITUTOYO CORPORATION
- Hideyuki NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR SIGNAL DETECTOR
- Publication number 20150369655
- Publication date Dec 24, 2015
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING MACHINE AND METHOD FOR CALCULATING CORRECTION...
- Publication number 20150241194
- Publication date Aug 27, 2015
- MITUTOYO CORPORATION
- Hideyuki NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS AND SHAPE MEASUREMENT ERROR CORRECTION ME...
- Publication number 20150233692
- Publication date Aug 20, 2015
- MITUTOYO CORPORATION
- Hideyuki NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING MACHINE AND METHOD OF CORRECTING SHAPE MEASUREMENT...
- Publication number 20140130362
- Publication date May 15, 2014
- MITUTOYO CORPORATION
- Nobuhiro ISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING MACHINE AND METHOD OF CORRECTING SHAPE MEASUREMENT...
- Publication number 20140059872
- Publication date Mar 6, 2014
- MITUTOYO CORPORATION
- Hideyuki NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR, ATTITUDE DETECTOR, CONTACT PROBE, AND MULTI-SENSING P...
- Publication number 20130176575
- Publication date Jul 11, 2013
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Application
Surface-profile measuring instrument
- Publication number 20080065341
- Publication date Mar 13, 2008
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Measuring apparatus, method of measuring surface texture and comput...
- Publication number 20070271803
- Publication date Nov 29, 2007
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Position control device, measuring device and machining device
- Publication number 20060161274
- Publication date Jul 20, 2006
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G05 - CONTROLLING REGULATING
Information Patent Application
Control device
- Publication number 20060119307
- Publication date Jun 8, 2006
- Mitutoyo Corporation
- Shingo Kiyotani
- G05 - CONTROLLING REGULATING
Information Patent Application
Amplitude-detecting method and circuit
- Publication number 20020016160
- Publication date Feb 7, 2002
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING

Nobuhiro ISHIKAWA

Person

Patents Grantslast 30 patents

Coordinate measuring machine and coordinate correction method

Coordinate correction method and coordinate measuring machine

Coordinate measuring machine and coordinate correction method

Measuring probe

Measuring probe

Sensor signal contact detector circuit

Coordinate measuring machine and method for calculating correction...

Form measuring machine and form measuring method

Method of correcting measurement error of shape measuring apparatus...

Shape measuring apparatus and shape measurement error correction me...

Shape measuring machine and method of correcting shape measurement...

Shape measuring machine and method of correcting shape measurement...

Image sensor, attitude detector, contact probe, and multi-sensing p...

Surface-profile measuring instrument

Control device

Measuring apparatus, method of measuring surface texture and comput...

Position control device, measuring device and machining device

Amplitude-detecting method and circuit

Method and apparatus for measuring optical wavelength

Touch signal probe

Non-directional touch signal probe

Measuring method and measuring instrument

DC level transition detecting circuit for sensor devices

Amplitude detecting device

Patents Applicationslast 30 patents

COORDINATE MEASURING MACHINE AND COORDINATE CORRECTION METHOD

COORDINATE MEASURING MACHINE AND COORDINATE CORRECTION METHOD

COORDINATE CORRECTION METHOD AND COORDINATE MEASURING MACHINE

MEASURING PROBE

MEASURING PROBE

FORM MEASURING MACHINE AND FORM MEASURING METHOD

METHOD OF CORRECTING MEASUREMENT ERROR OF SHAPE MEASURING APPARATUS...

SENSOR SIGNAL DETECTOR

COORDINATE MEASURING MACHINE AND METHOD FOR CALCULATING CORRECTION...

SHAPE MEASURING APPARATUS AND SHAPE MEASUREMENT ERROR CORRECTION ME...

SHAPE MEASURING MACHINE AND METHOD OF CORRECTING SHAPE MEASUREMENT...

SHAPE MEASURING MACHINE AND METHOD OF CORRECTING SHAPE MEASUREMENT...

IMAGE SENSOR, ATTITUDE DETECTOR, CONTACT PROBE, AND MULTI-SENSING P...

Surface-profile measuring instrument

Measuring apparatus, method of measuring surface texture and comput...

Position control device, measuring device and machining device

Control device

Amplitude-detecting method and circuit