Nobuhiro Katsuma

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Shiga, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device and inspection method
- Patent number 7,696,767
- Issue date Apr 13, 2010
- Panasonic Corporation
- Keisuke Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 7,598,756
- Issue date Oct 6, 2009
- Panasonic Corporation
- Keisuke Inoue
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TESTING APPARATUS AND TESTING METHOD
- Publication number 20110298487
- Publication date Dec 8, 2011
- Nobuhiro KATSUMA
- G01 - MEASURING TESTING
Information Patent Application
Inspection device and inspection method
- Publication number 20090278559
- Publication date Nov 12, 2009
- PANASONIC CORPORATION
- Keisuke Inoue
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTIVE CONTACT PIN AND SEMICONDUCTOR TESTING EQUIPMENT
- Publication number 20090243640
- Publication date Oct 1, 2009
- Panasonic Corporation
- Nobuhiro Katsuma
- G01 - MEASURING TESTING
Information Patent Application
Inspection device and inspection method
- Publication number 20070109000
- Publication date May 17, 2007
- Matsushita Electric Industrial Co., Ltd.
- Keisuke Inoue
- G01 - MEASURING TESTING