Membership
Tour
Register
Log in
Nobuhiro Obara
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Defect inspection device and defect inspection method
Patent number
12,044,627
Issue date
Jul 23, 2024
HITACHI HIGH-TECH CORPORATION
Masaya Yamamoto
G02 - OPTICS
Information
Patent Grant
Inspection device and inspection method thereof
Patent number
11,346,791
Issue date
May 31, 2022
HITACHI HIGH-TECH CORPORATION
Masami Makuuchi
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection device
Patent number
11,143,600
Issue date
Oct 12, 2021
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Method for Defect Inspection, System, and Computer-Readable Medium
Publication number
20230175981
Publication date
Jun 8, 2023
Hitachi High-Tech Corporation
Takanori KONDO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Defect Inspection Apparatus and Defect Inspection Method
Publication number
20230175979
Publication date
Jun 8, 2023
Hitachi High-Tech Corporation
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20220357285
Publication date
Nov 10, 2022
Hitachi High-Tech Corporation
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Application
Defect Inspection Device and Defect Inspection Method
Publication number
20220317058
Publication date
Oct 6, 2022
Hitachi High-Tech Corporation
Masaya YAMAMOTO
G02 - OPTICS
Information
Patent Application
INSPECTION DEVICE AND INSPECTION METHOD THEREOF
Publication number
20200393388
Publication date
Dec 17, 2020
Hitachi High-Tech Corporation
Masami Makuuchi
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE
Publication number
20200371047
Publication date
Nov 26, 2020
Hitachi High-Tech Corporation
Toshifumi Honda
G01 - MEASURING TESTING