Nobuhiro Okai

Person

Kokubunji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image processing system
- Patent number 11,852,599
- Issue date Dec 26, 2023
- HITACHI HIGH-TECH CORPORATION
- Nobuhiro Okai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,211,224
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,121,632
- Issue date Nov 6, 2018
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam microscope
- Patent number 9,261,360
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 8,969,801
- Issue date Mar 3, 2015
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 8,907,267
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 8,742,342
- Issue date Jun 3, 2014
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope optical condition setting method and s...
- Patent number 8,692,197
- Issue date Apr 8, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling charging of sample and scanning electron mic...
- Patent number 8,487,251
- Issue date Jul 16, 2013
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,125,518
- Issue date Feb 28, 2012
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting reticle
- Patent number 8,064,681
- Issue date Nov 22, 2011
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope
- Publication number 20230238212
- Publication date Jul 27, 2023
- Hitachi High-Tech Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING SYSTEM
- Publication number 20220042936
- Publication date Feb 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Nobuhiro Okai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210249221
- Publication date Aug 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Nobuhiro OKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20170316915
- Publication date Nov 2, 2017
- Hitachi High-Technologies Corporation
- Nobuhiro OKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20140299769
- Publication date Oct 9, 2014
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20140217274
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Microscope
- Publication number 20120327213
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- G01 - MEASURING TESTING
Information Patent Application
Scanning Electron Microscope Optical Condition Setting Method and S...
- Publication number 20120318977
- Publication date Dec 20, 2012
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20120217393
- Publication date Aug 30, 2012
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20110249110
- Publication date Oct 13, 2011
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING CHARGING OF SAMPLE AND SCANNING ELECTRON MIC...
- Publication number 20110139981
- Publication date Jun 16, 2011
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for inspecting reticle
- Publication number 20090136116
- Publication date May 28, 2009
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- G06 - COMPUTING CALCULATING COUNTING

Nobuhiro Okai

Person

Patents Grantslast 30 patents

Image processing system

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam microscope

Scanning electron microscope

Charged particle beam device

Electron microscope

Scanning electron microscope optical condition setting method and s...

Method for controlling charging of sample and scanning electron mic...

Scanning electron microscope

Method and apparatus for inspecting reticle

Patents Applicationslast 30 patents

Electron Microscope

IMAGE PROCESSING SYSTEM

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam Apparatus

SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Microscope

Scanning Electron Microscope Optical Condition Setting Method and S...

Electron Microscope

SCANNING ELECTRON MICROSCOPE

METHOD FOR CONTROLLING CHARGING OF SAMPLE AND SCANNING ELECTRON MIC...

Method and apparatus for inspecting reticle