Nobuhiro Shimizu

Person

Chiba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Microprobe and scanning probe apparatus having microprobe
- Patent number 6,667,467
- Issue date Dec 23, 2003
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Microprobe and sample surface measuring apparatus
- Patent number 6,664,540
- Issue date Dec 16, 2003
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Multiprobe and scanning probe microscope
- Patent number 6,469,293
- Issue date Oct 22, 2002
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self-exciting and self-detecting probe and scanning probe apparatus
- Patent number 6,422,069
- Issue date Jul 23, 2002
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Correlation sample for scanning probe microscope and method of proc...
- Patent number 6,405,583
- Issue date Jun 18, 2002
- Seiko Instruments Inc.
- Yoshiharu Shirakawabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self-detecting type of SPM probe and SPM device
- Patent number 6,388,252
- Issue date May 14, 2002
- Seiko Instruments Inc.
- Hiroshi Takahashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for scanning probe microscope (SPM) and SPM device
- Patent number 6,383,823
- Issue date May 7, 2002
- Seiko Instruments Inc.
- Hiroshi Takahashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of fabricating probe force atomic force microscope
- Patent number 6,358,426
- Issue date Mar 19, 2002
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor strain sensor and scanning probe microscope using the...
- Patent number 6,211,540
- Issue date Apr 3, 2001
- Seiko Instruments Inc.
- Hiroshi Takahashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever unit and scanning probe microscope utilizing the cantile...
- Patent number 6,176,122
- Issue date Jan 23, 2001
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor manufacturing device
- Patent number 6,171,437
- Issue date Jan 9, 2001
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe microscope, and semiconductor distortion sensor for...
- Patent number 6,049,115
- Issue date Apr 11, 2000
- Seiko Instruments Inc.
- Hiroshi Takahashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever probe and scanning type probe microscope utilizing the c...
- Patent number 5,992,225
- Issue date Nov 30, 1999
- Seiko Instruments Inc.
- Yoshiharu Shirakawabe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Probe for atomic force microscope and atomic force microscope
- Patent number 5,877,412
- Issue date Mar 2, 1999
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Radial differential squid magnetic flux meter
- Patent number 5,825,183
- Issue date Oct 20, 1998
- Seiko Instruments Inc.
- Toshimitsu Morooka
- G01 - MEASURING TESTING
Information Patent Grant
DC superconducting quantum interference device with shield layer
- Patent number 5,548,130
- Issue date Aug 20, 1996
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field detecting circuit having a relaxation oscillator SQUID
- Patent number 5,406,201
- Issue date Apr 11, 1995
- Seiko Instruments Inc.
- Shogo Kiryu
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing DC superconducting quantum interference d...
- Patent number 5,306,521
- Issue date Apr 26, 1994
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for detecting a fine magnetic field with a signal adjusti...
- Patent number 5,231,353
- Issue date Jul 27, 1993
- Seiko Instruments Inc.
- Satoshi Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Highly sensitive magnetic field detecting SQUID with dual demodulat...
- Patent number 5,173,659
- Issue date Dec 22, 1992
- Seiko Instruments Inc.
- Norio Chiba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Microprobe and scanning type probe apparatus using thereof
- Publication number 20020020805
- Publication date Feb 21, 2002
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Microprobe and sample surface measuring apparatus
- Publication number 20010028033
- Publication date Oct 11, 2001
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY

Nobuhiro Shimizu

Person

Patents Grantslast 30 patents

Microprobe and scanning probe apparatus having microprobe

Microprobe and sample surface measuring apparatus

Multiprobe and scanning probe microscope

Self-exciting and self-detecting probe and scanning probe apparatus

Correlation sample for scanning probe microscope and method of proc...

Self-detecting type of SPM probe and SPM device

Probe for scanning probe microscope (SPM) and SPM device

Method of fabricating probe force atomic force microscope

Semiconductor strain sensor and scanning probe microscope using the...

Cantilever unit and scanning probe microscope utilizing the cantile...

Semiconductor manufacturing device

Scanning probe microscope, and semiconductor distortion sensor for...

Cantilever probe and scanning type probe microscope utilizing the c...

Probe for atomic force microscope and atomic force microscope

Radial differential squid magnetic flux meter

DC superconducting quantum interference device with shield layer

Magnetic field detecting circuit having a relaxation oscillator SQUID

Process for manufacturing DC superconducting quantum interference d...

Apparatus for detecting a fine magnetic field with a signal adjusti...

Highly sensitive magnetic field detecting SQUID with dual demodulat...

Patents Applicationslast 30 patents

Microprobe and scanning type probe apparatus using thereof

Microprobe and sample surface measuring apparatus