Nobuhisa Nishioki

Person

Tsukuba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Reseat system of touch signal probe
- Patent number 6,678,966
- Issue date Jan 20, 2004
- Mitutoyo Corporation
- Satoshi Koga
- G01 - MEASURING TESTING
Information Patent Grant
Reseat system for touch probe in coordinates measuring machine
- Patent number 6,523,273
- Issue date Feb 25, 2003
- Mitutoyo Corporation
- Nobuhisa Nishioki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring optical wavelength
- Patent number 6,507,404
- Issue date Jan 14, 2003
- Mitutoyo Corporation
- Nobuhisa Nishioki
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for absolute measurement of displacement
- Patent number 6,496,266
- Issue date Dec 17, 2002
- Mitutoyo Corporation
- Nobuhisa Nishioki
- G01 - MEASURING TESTING
Information Patent Grant
Touch signal probe
- Patent number 6,360,176
- Issue date Mar 19, 2002
- Mitutoyo Corporation
- Nobuhisa Nishioki
- G01 - MEASURING TESTING
Information Patent Grant
Touch signal probe
- Patent number 6,327,789
- Issue date Dec 11, 2001
- Mitutoyo Corp.
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Touch-signal probe
- Patent number 6,198,298
- Issue date Mar 6, 2001
- Mitutoyo Corporation
- Nobuhisa Nishioki
- G01 - MEASURING TESTING
Information Patent Grant
Grating-interference type displacement meter apparatus
- Patent number 5,035,507
- Issue date Jul 30, 1991
- Mitutoyo Corporation
- Nobuhisa Nishioki
- G01 - MEASURING TESTING

Nobuhisa Nishioki

Person

Patents Grantslast 30 patents

Reseat system of touch signal probe

Reseat system for touch probe in coordinates measuring machine

Method and apparatus for measuring optical wavelength

Measuring device for absolute measurement of displacement

Touch signal probe

Touch signal probe

Touch-signal probe

Grating-interference type displacement meter apparatus