Nobukatsu MACHII

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement processing device, measurement processing method, measu...
- Patent number 11,016,039
- Issue date May 25, 2021
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, measurement processing method, measu...
- Patent number 11,016,038
- Issue date May 25, 2021
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, x-ray inspection apparatus, method f...
- Patent number 10,760,902
- Issue date Sep 1, 2020
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, x-ray inspection apparatus, method f...
- Patent number 10,557,706
- Issue date Feb 11, 2020
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, x-ray inspection apparatus, method f...
- Patent number 10,502,562
- Issue date Dec 10, 2019
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SETTING METHOD, INSPECTION METHOD, DEFECT EVALUATION DEVICE AND STR...
- Publication number 20240036221
- Publication date Feb 1, 2024
- Nikon Corporation
- Fuminori HAYANO
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, PROGRAM, AND WORK PROCESS GENERATION...
- Publication number 20200124414
- Publication date Apr 23, 2020
- Nikon Corporation
- Masaya YAMAGUCHI
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
SETTING METHOD, INSPECTION METHOD, DEFECT EVALUATION DEVICE AND STR...
- Publication number 20190310385
- Publication date Oct 10, 2019
- Nikon Corporation
- Fuminori HAYANO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROCESSING DEVICE, MEASUREMENT PROCESSING METHOD, MEASU...
- Publication number 20190195811
- Publication date Jun 27, 2019
- Nikon Corporation
- Nobukatsu MACHII
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION APPARATUS, METHOD F...
- Publication number 20180372485
- Publication date Dec 27, 2018
- Nikon Corporation
- Nobukatsu MACHII
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROCESSING DEVICE, MEASUREMENT PROCESSING METHOD, MEASU...
- Publication number 20170241919
- Publication date Aug 24, 2017
- NOBUKATSU MACHII
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION APPARATUS, METHOD F...
- Publication number 20170176181
- Publication date Jun 22, 2017
- Nikon Corporation
- Nobukatsu MACHII
- G01 - MEASURING TESTING

Nobukatsu MACHII

Person

Patents Grantslast 30 patents

Measurement processing device, measurement processing method, measu...

Measurement processing device, measurement processing method, measu...

Measurement processing device, x-ray inspection apparatus, method f...

Measurement processing device, x-ray inspection apparatus, method f...

Measurement processing device, x-ray inspection apparatus, method f...

Patents Applicationslast 30 patents

SETTING METHOD, INSPECTION METHOD, DEFECT EVALUATION DEVICE AND STR...

INFORMATION PROCESSING DEVICE, PROGRAM, AND WORK PROCESS GENERATION...

SETTING METHOD, INSPECTION METHOD, DEFECT EVALUATION DEVICE AND STR...

MEASUREMENT PROCESSING DEVICE, MEASUREMENT PROCESSING METHOD, MEASU...

MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION APPARATUS, METHOD F...

MEASUREMENT PROCESSING DEVICE, MEASUREMENT PROCESSING METHOD, MEASU...

MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION APPARATUS, METHOD F...