Nobukazu Ido

Follow

Person

Chigasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 8,175,820
- Issue date May 8, 2012
- IHI Corporation
- Hiroaki Hatanaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20090105967
- Publication date Apr 23, 2009
- Hiroaki Hatanaka
- G01 - MEASURING TESTING