Nobukazu OBA

Person

Kariya-city, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 9,868,629
- Issue date Jan 16, 2018
- Denso Corporation
- Nobukazu Oba
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Signal processing circuit for rotation detecting device
- Patent number 8,130,115
- Issue date Mar 6, 2012
- Denso Corporation
- Norihiro Kurumado
- G01 - MEASURING TESTING
Information Patent Grant
Peak voltage detector circuit and binarizing circuit including the...
- Patent number 8,008,948
- Issue date Aug 30, 2011
- Denso Corporation
- Yasuaki Makino
- G01 - MEASURING TESTING
Information Patent Grant
Sensor failure or abnormality detecting system incorporated in a ph...
- Patent number 6,422,088
- Issue date Jul 23, 2002
- Denso Corporation
- Nobukazu Oba
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device having malfunction detector
- Patent number 6,401,018
- Issue date Jun 4, 2002
- Denso Corporation
- Nobukazu Oba
- G01 - MEASURING TESTING
Information Patent Grant
Pressure-detecting device coupling member with interchangeable conn...
- Patent number 6,389,903
- Issue date May 21, 2002
- Denso Corporation
- Nobukazu Oba
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor having fault detection function
- Patent number 6,343,498
- Issue date Feb 5, 2002
- Denso Corporation
- Nobukazu Oba
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor type physical quantity sensor
- Patent number 5,986,316
- Issue date Nov 16, 1999
- Denso Corporation
- Inao Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Sensor chip having a diode portions and a thin-wall portion
- Patent number 5,932,921
- Issue date Aug 3, 1999
- Denso Corporation
- Minekazu Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method for producing the same
- Patent number 5,920,106
- Issue date Jul 6, 1999
- Denso Corporation
- Nobukazu Oba
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor pressure sensor that suppresses non-linear temperatur...
- Patent number 5,761,957
- Issue date Jun 9, 1998
- Denso Corporation
- Nobukazu Oba
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20170144882
- Publication date May 25, 2017
- Denso Corporation
- Nobukazu OBA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SIGNAL PROCESSING CIRCUIT FOR ROTATION DETECTING DEVICE
- Publication number 20100019917
- Publication date Jan 28, 2010
- DENSO CORPORATION
- Norihiro Kurumado
- G01 - MEASURING TESTING
Information Patent Application
Noise removal circuit and comparator circuit including same
- Publication number 20090002033
- Publication date Jan 1, 2009
- DENSO CORPORATION
- Shinji Nakatani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Peak voltage detector circuit and binarizing circuit including the...
- Publication number 20080211544
- Publication date Sep 4, 2008
- DENSO CORPORATION
- Yasuaki Makino
- G01 - MEASURING TESTING

Nobukazu OBA

Person

Patents Grantslast 30 patents

Semiconductor device

Signal processing circuit for rotation detecting device

Peak voltage detector circuit and binarizing circuit including the...

Sensor failure or abnormality detecting system incorporated in a ph...

Sensor device having malfunction detector

Pressure-detecting device coupling member with interchangeable conn...

Physical quantity sensor having fault detection function

Semiconductor type physical quantity sensor

Sensor chip having a diode portions and a thin-wall portion

Semiconductor device and method for producing the same

Semiconductor pressure sensor that suppresses non-linear temperatur...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SIGNAL PROCESSING CIRCUIT FOR ROTATION DETECTING DEVICE

Noise removal circuit and comparator circuit including same

Peak voltage detector circuit and binarizing circuit including the...