Nobuo Fujisaki

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Ina-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for inspecting a substrate
- Patent number 6,707,546
- Issue date Mar 16, 2004
- Olympus Optical Co., Ltd.
- Hiroyuki Okahira
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting a substrate
- Patent number 6,671,041
- Issue date Dec 30, 2003
- Olympus Optical Co., Ltd.
- Hiroyuki Okahira
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting a substrate
- Patent number 6,362,884
- Issue date Mar 26, 2002
- Olympus Optical Co., Ltd.
- Hiroyuki Okahira
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for inspecting a substrate
- Publication number 20020057429
- Publication date May 16, 2002
- Olympus Optical Co., Ltd.
- Hiroyuki Okahira
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for inspecting a substrate
- Publication number 20010002862
- Publication date Jun 7, 2001
- Hiroyuki Okahira
- G01 - MEASURING TESTING