Nobuo Hori

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Interference measurement apparatus and probe used for interference...
- Patent number 6,233,370
- Issue date May 15, 2001
- Kabushiki Kaisha Topcon
- Makoto Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Interference measurement apparatus, interference measurement probe...
- Patent number 6,166,818
- Issue date Dec 26, 2000
- Kabushiki Kaisha Topcon
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Signal formation apparatus for use in interference measurement
- Patent number 6,075,600
- Issue date Jun 13, 2000
- Kabushiki Kaisha Topcon
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring cross-sectional distribution of refractive...
- Patent number 5,349,431
- Issue date Sep 20, 1994
- Kabushiki Kaisha Topcon
- Nicolas Gisin
- G01 - MEASURING TESTING
Information Patent Grant
Method for patterning an optical device for optical IC, and an opti...
- Patent number 5,337,169
- Issue date Aug 9, 1994
- Kabushiki Kaisha Topcon
- Nobuo Hori
- G02 - OPTICS
Information Patent Grant
Apparatus for measuring cross-sectional distribution of refractive...
- Patent number 5,280,334
- Issue date Jan 18, 1994
- Kabushiki Kaisha Topcon
- Nicolas Gisin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring cross-sectional distribution of refractive...
- Patent number 5,278,628
- Issue date Jan 11, 1994
- Kabushiki Kaisha Topcon
- Nicolas Gisin
- G01 - MEASURING TESTING
Information Patent Grant
Light wave range finder
- Patent number 4,986,653
- Issue date Jan 22, 1991
- Kabushiki Kaisha Topcon
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for finding range
- Patent number 4,973,153
- Issue date Nov 27, 1990
- Kabushiki Kaisha Topcon
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Integrated-photocircuit interferometer
- Patent number 4,941,744
- Issue date Jul 17, 1990
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Light interferometer
- Patent number 4,909,629
- Issue date Mar 20, 1990
- Kabushiki Kaisha Topcon
- Takashi Yokokura
- G01 - MEASURING TESTING
Information Patent Grant
Optical adapter for a light-wave rangefinder
- Patent number 4,692,023
- Issue date Sep 8, 1987
- Tokyo Kagaku Kikai Kabushiki Kaisha
- Fumio Ohtomo
- G02 - OPTICS
Information Patent Grant
Inclination measuring instrument
- Patent number 4,660,290
- Issue date Apr 28, 1987
- Tokyo Kagaku Kikai Kabushiki Kaisha
- Nobuo Hori
- G01 - MEASURING TESTING
Information Patent Grant
Tilt angle detection device
- Patent number 4,628,612
- Issue date Dec 16, 1986
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Nobuo Hori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Card true/false decision apparatus
- Publication number 20040031849
- Publication date Feb 19, 2004
- Nobuo Hori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Card true/false decision apparatus
- Publication number 20040016810
- Publication date Jan 29, 2004
- Nobuo Hori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Card genuine judging apparatus and card genuine judging system
- Publication number 20020131597
- Publication date Sep 19, 2002
- Nobuo Hori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Interference measurement apparatus and probe used for interference...
- Publication number 20010014191
- Publication date Aug 16, 2001
- Makoto Fujino
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Interference measurement apparatus and probe used for interference...

Interference measurement apparatus, interference measurement probe...

Signal formation apparatus for use in interference measurement

Apparatus for measuring cross-sectional distribution of refractive...

Method for patterning an optical device for optical IC, and an opti...

Apparatus for measuring cross-sectional distribution of refractive...

Apparatus for measuring cross-sectional distribution of refractive...

Light wave range finder

Method and apparatus for finding range

Integrated-photocircuit interferometer

Light interferometer

Optical adapter for a light-wave rangefinder

Inclination measuring instrument

Tilt angle detection device

Patents Applicationslast 30 patents

Card true/false decision apparatus

Card true/false decision apparatus

Card genuine judging apparatus and card genuine judging system

Interference measurement apparatus and probe used for interference...