Nobuo Motoki

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Isezaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pulse generation circuit and semiconductor tester that uses the pul...
- Patent number 7,085,982
- Issue date Aug 1, 2006
- Hitachi, Ltd.
- Kenichi Shinbo
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 6,768,953
- Issue date Jul 27, 2004
- Hitachi, Ltd.
- Fujio Oonishi
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 6,697,755
- Issue date Feb 24, 2004
- Hitachi, Ltd.
- Fujio Oonishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test apparatus
- Publication number 20030167145
- Publication date Sep 4, 2003
- Hitachi, Ltd
- Fujio Oonishi
- G01 - MEASURING TESTING
Information Patent Application
Pulse generation circuit and semiconductor tester that uses the pul...
- Publication number 20030140286
- Publication date Jul 24, 2003
- Kenichi Shinbo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Test apparatus
- Publication number 20030040874
- Publication date Feb 27, 2003
- HITACHI, LTD.
- Fujio Oonishi
- G01 - MEASURING TESTING