Nobuo Taguchi

Person

  • Fuchu, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Nondestructive examining apparatus

    • Patent number 4,272,781
    • Issue date Jun 9, 1981
    • Tokyo Shibaura Denki Kabushiki Kaisha
    • Nobuo Taguchi
    • G01 - MEASURING TESTING