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Nobutoshi OTA
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Suita-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Interferometric method for measuring a size of particle in the pres...
Patent number
10,429,287
Issue date
Oct 1, 2019
Osaka University
Makoto Kawano
G02 - OPTICS
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Patent Grant
Method for measuring characteristics of a particle and device for m...
Patent number
10,261,050
Issue date
Apr 16, 2019
Osaka University
Makoto Kawano
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
OBSERVATION APPARATUS, DEVICE, DEVICE PRODUCTION METHOD, PARTICLE S...
Publication number
20160349165
Publication date
Dec 1, 2016
OSAKA UNIVERSITY
Makoto KAWANO
G01 - MEASURING TESTING
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Patent Application
PARTICLE ANALYSIS METHOD AND PARTICLE ANALYSIS DEVICE
Publication number
20160209366
Publication date
Jul 21, 2016
OSAKA UNIVERSITY
Makoto KAWANO
G01 - MEASURING TESTING