Nobuyoshi Hattori

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Information processing device, imaging device, and system
- Patent number 10,868,921
- Issue date Dec 15, 2020
- Ricoh Company, Ltd.
- Tatsuya Aizawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 7,674,668
- Issue date Mar 9, 2010
- Renesas Technology Corp.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,914,307
- Issue date Jul 5, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing SOI wafer
- Patent number 6,844,242
- Issue date Jan 18, 2005
- Renesas Technology Corp.
- Hideki Naruoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computer-implemented method of process analysis
- Patent number 6,769,111
- Issue date Jul 27, 2004
- Renesas Technology Corp.
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computer-implemented method of defect analysis
- Patent number 6,741,940
- Issue date May 25, 2004
- Renesas Technology Corp.
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 6,646,306
- Issue date Nov 11, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect analysis method and process control method
- Patent number 6,473,665
- Issue date Oct 29, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI substrate and semiconductor device
- Patent number 6,465,316
- Issue date Oct 15, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Nobuyoshi Hattori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing SOI substrate and semiconductor device
- Patent number 6,372,593
- Issue date Apr 16, 2002
- Mitsubishi Denki Kabushika Kaisha
- Nobuyoshi Hattori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect analysis method and process control method
- Patent number 6,341,241
- Issue date Jan 22, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and semiconductor storage device
- Patent number 6,252,294
- Issue date Jun 26, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Nobuyoshi Hattori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quality management system and recording medium
- Patent number 6,202,037
- Issue date Mar 13, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Nobuyoshi Hattori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection data analyzing apparatus for in-line inspection with enh...
- Patent number 6,016,562
- Issue date Jan 18, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting and examining slightly irregular surface state...
- Patent number 5,517,027
- Issue date May 14, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitsugu Nakagawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cleaning device for semiconductor wafers
- Patent number 5,129,198
- Issue date Jul 14, 1992
- Taiyo Sanso Co., Ltd.
- Itaru Kanno
- B24 - GRINDING POLISHING
Information Patent Grant
Continuous rainwater monitoring system
- Patent number 5,048,331
- Issue date Sep 17, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Nobuyoshi Hattori
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for counting particles attached to surfaces of a solid
- Patent number 4,893,320
- Issue date Jan 9, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Motonori Yanagi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING DEVICE, IMAGING DEVICE, AND SYSTEM
- Publication number 20190149673
- Publication date May 16, 2019
- RICOH COMPANY, LTD.
- Tatsuya AIZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of manufacturing a semiconductor device
- Publication number 20080188043
- Publication date Aug 7, 2008
- Renesas Technology Corp.
- Norio Ishitsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20050212056
- Publication date Sep 29, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20040046216
- Publication date Mar 11, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Computer-implemented method of process analysis
- Publication number 20030065411
- Publication date Apr 3, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Computer-implemented method of defect analysis
- Publication number 20030060985
- Publication date Mar 27, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing SOI wafer
- Publication number 20030013273
- Publication date Jan 16, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hideki Naruoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20020060320
- Publication date May 23, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Iwamatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI substrate and semiconductor device
- Publication number 20020019105
- Publication date Feb 14, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Nobuyoshi Hattori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Defect analysis method and process control method
- Publication number 20020002415
- Publication date Jan 3, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS

Nobuyoshi Hattori

Person

Patents Grantslast 30 patents

Information processing device, imaging device, and system

Method of manufacturing a semiconductor device

Semiconductor device and method of manufacturing the same

Method of manufacturing SOI wafer

Computer-implemented method of process analysis

Computer-implemented method of defect analysis

Semiconductor device

Defect analysis method and process control method

SOI substrate and semiconductor device

Method of manufacturing SOI substrate and semiconductor device

Defect analysis method and process control method

Semiconductor device and semiconductor storage device

Quality management system and recording medium

Inspection data analyzing apparatus for in-line inspection with enh...

Method for detecting and examining slightly irregular surface state...

Cleaning device for semiconductor wafers

Continuous rainwater monitoring system

Apparatus for counting particles attached to surfaces of a solid

Patents Applicationslast 30 patents

INFORMATION PROCESSING DEVICE, IMAGING DEVICE, AND SYSTEM

Method of manufacturing a semiconductor device

Semiconductor device and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Computer-implemented method of process analysis

Computer-implemented method of defect analysis

Method of manufacturing SOI wafer

Semiconductor device and method of manufacturing the same

SOI substrate and semiconductor device

Defect analysis method and process control method